Inventor · disambiguated record
Kazuya Terabe
Also filed as: TERABE KAZUYA
14 granted patents·220 citations·filing 1999–2021
91Inventor score
Files withJAPAN SCIENCE & TECH AGENCY3JAPAN SCIENCE & TECH CORP3NAT INST FOR MATERIALS SCIENCE3HASEGAWA TSUYOSHI2LIU XIAOYAN1
Top patents by PatentIndex Score
14 records- 0196US7525410B2Point contact array, not circuit, and electronic circuit using the sameJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Apr 28, 2009·50 cites·4 claims
- 0294US7026911B2Point contact array, not circuit, and electronic circuit comprising the sameRIKEN·Filed 2001·Granted Apr 11, 2006·73 cites·10 claims
- 0392US7473982B2Point contact array, not circuit, and electronic circuit comprising the sameJAPAN SCIENCE & TECH AGENCY·Filed 2004·Granted Jan 6, 2009·56 cites·3 claims
- 0480US7976717B2Method of forming polarization reversal area, apparatus thereof and device using itNAT INST FOR MATERIALS SCIENCE·Filed 2006·Granted Jul 12, 2011·7 cites·15 claims
- 0570US12315877B2Solid electrolyte and magnesium secondary battery using samePANASONIC CORP·Filed 2021·Granted May 27, 2025·0 cites·10 claims
- 0668US6833719B2Apparatus for evaluating electrical characteristicsJAPAN SCIENCE & TECH CORP·Filed 2000·Granted Dec 21, 2004·15 cites·7 claims
- 0757US8223427B2Method of fixing polarization-reversed region formed in ferroelectric single crystalLIU XIAOYAN·Filed 2007·Granted Jul 17, 2012·1 cites·6 claims
- 0856US8320154B2Switching element and application of the sameHASEGAWA TSUYOSHI·Filed 2008·Granted Nov 27, 2012·1 cites·10 claims
- 0952US9627499B2Electrical conduction element, electronic device, and method for operating electrical conduction elementNAT INST FOR MATERIALS SCIENCE·Filed 2014·Granted Apr 18, 2017·0 cites·15 claims
- 1048US6891186B2Electronic device having controllable conductanceJAPAN SCIENCE & TECH CORP·Filed 2001·Granted May 10, 2005·3 cites·20 claims
- 1145US7875883B2Electric device using solid electrolyteJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted Jan 25, 2011·4 cites·11 claims
- 1243US7446930B2Method of inverting polarization by controlling defect density or degree of order of lattice pointsNAT INST FOR MATERIALS SCIENCE·Filed 2004·Granted Nov 4, 2008·2 cites·18 claims
- 1341US6608306B1Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structureJAPAN SCIENCE & TECH CORP·Filed 1999·Granted Aug 19, 2003·8 cites·5 claims
- 1431US8896033B2Electrochemical transistorHASEGAWA TSUYOSHI·Filed 2011·Granted Nov 25, 2014·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →