Inventor · disambiguated record
Motohiro Kono
Also filed as: KONO MOTOHIRO
11 granted patents·2 pending applications·137 citations·filing 1986–2020
87Inventor score
Top patents by PatentIndex Score
13 records- 0194US4746857AProbing apparatus for measuring electrical characteristics of semiconductor device formed on waferDAINIPPON SCREEN MFG·Filed 1986·Granted May 24, 1988·108 cites·11 claims
- 0281US11986867B2Substrate processing method and substrate processing apparatusSCREEN HOLDINGS CO LTD·Filed 2020·Granted May 21, 2024·1 cites·8 claims
- 0381US9766132B2Measuring apparatus and measuring methodSCREEN HOLDINGS CO LTD·Filed 2016·Granted Sep 19, 2017·2 cites·6 claims
- 0464US6915232B2Film thickness measuring method, relative dielectric constant measuring method, film thickness measuring apparatus, and relative dielectric constant measuring apparatusDAINIPPON SCREEN MFG·Filed 2003·Granted Jul 5, 2005·7 cites·11 claims
- 0554US7598746B2Surface voltmeter and surface voltage measurement methodDAINIPPON SCREEN MFG·Filed 2007·Granted Oct 6, 2009·2 cites·20 claims
- 0652US7795886B2Surface voltmeterDAINIPPON SCREEN MFG·Filed 2008·Granted Sep 14, 2010·2 cites·18 claims
- 0751US2009019722A1Apparatus and method for removing organic contamination adsorbed onto substrate, and apparatus and method for measuring thickness of thin film formed on substrateDAINIPPON SCREEN MFG·Filed 2008·Application pending·0 cites
- 0848US11267729B2In-liquid plasma generation device and liquid treatment apparatusSCREEN HOLDINGS CO LTD·Filed 2018·Granted Mar 8, 2022·0 cites·13 claims
- 0945US6037781AMeasurement of electrical characteristics of semiconductor waferDAINIPPON SCREEN MFG·Filed 1998·Granted Mar 14, 2000·12 cites·13 claims
- 1044US2005198857A1Apparatus and method for removing organic contamination adsorbed onto substrate, and apparatus and method for measuring thickness of thin film formed on substrateDAINIPPON SCREEN MFG·Filed 2005·Application pending·0 cites
- 1138US7427520B2Method and apparatus for measuring thickness of thin film formed on substrateDAINIPPON SCREEN MFG·Filed 2005·Granted Sep 23, 2008·0 cites·8 claims
- 1236US7375537B2Method and apparatus for measuring relative dielectric constantDAINIPPON SCREEN MFG·Filed 2005·Granted May 20, 2008·0 cites·13 claims
- 1332US6278267B1Method of determining impurity content and apparatus for the sameDAINIPPON SCREEN MFG·Filed 1998·Granted Aug 21, 2001·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →