Inventor · disambiguated record
Hu-Wei Lin
Also filed as: LIN HU-WEI
8 granted patents·3 pending applications·6 citations·filing 2013–2025
77Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11
Top patents by PatentIndex Score
11 records- 0180US10283457B2Method for lithographically forming wafer identification marks and alignment marksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 7, 2019·2 cites·20 claims
- 0277US10283456B2Lithography engraving machine for forming water identification marks and aligment marksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 7, 2019·2 cites·20 claims
- 0372US2024395571A1Apparatus and methods for cleaning a packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0472US2025299314A1Automatic optical inspection system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0567US12367569B2Automatic optical inspection system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 22, 2025·0 cites·20 claims
- 0665US12322608B2Apparatus and methods for cleaning a packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 3, 2025·0 cites·20 claims
- 0764US11562968B2Apparatus for lithographically forming wafer identification marks and alignment marksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 24, 2023·0 cites·20 claims
- 0863US9720325B2Photoresist coating schemeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 1, 2017·2 cites·21 claims
- 0953US2023386875A1Under boat support with electrostatic discharge structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1048US9097972B2Method of applying photoresist to a semiconductor substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 4, 2015·0 cites·20 claims
- 1147US9575012B2Automated wafer inspectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Feb 21, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →