Inventor · disambiguated record
Ifar Wan
Also filed as: WAN IFAR
3 granted patents·7 citations·filing 2013–2016
60Inventor score
Files withINTEL CORP3
Top patents by PatentIndex Score
3 records- 0175US9922725B2Integrated circuit defect detection and repairINTEL CORP·Filed 2016·Granted Mar 20, 2018·2 cites·21 claims
- 0271US9548137B2Integrated circuit defect detection and repairINTEL CORP·Filed 2014·Granted Jan 17, 2017·4 cites·25 claims
- 0357US9564245B2Integrated circuit defect detection and repairINTEL CORP·Filed 2013·Granted Feb 7, 2017·1 cites·22 claims
Join the waitlist — get patent alerts
Get an alert when Ifar Wan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →