Inventor · disambiguated record
Seung-Bum Ko
Also filed as: KO SEUNG-BUM
8 granted patents·2 pending applications·36 citations·filing 2000–2016
82Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9
Top patents by PatentIndex Score
10 records- 0173US7495973B2Circuit and method for controlling write recovery time in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 24, 2009·11 cites·12 claims
- 0271US7675797B2CAS latency circuit and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 9, 2010·8 cites·25 claims
- 0353US6496443B2Data buffer control circuits, integrated circuit memory devices and methods of operation thereof using read cycle initiated data buffer clock signalsSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 17, 2002·8 cites·25 claims
- 0448US9390772B2Semiconductor device including option pads for determining an operating structure thereof, and a system having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jul 12, 2016·0 cites·6 claims
- 0546US10403331B2Semiconductor device having a floating option pad, and a method for manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 3, 2019·0 cites·11 claims
- 0646US6944069B2Semiconductor memory device having column select line driving scheme for reducing skew between column select lines and column select line driving method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Sep 13, 2005·5 cites·8 claims
- 0744US6944089B2Synchronous semiconductor device having constant data output time regardless of bit organization, and method of adjusting data output timeSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Sep 13, 2005·4 cites·15 claims
- 0834US8045404B2Semiconductor memory device capable of preventing damage to a bitline during a data masking operationSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Oct 25, 2011·0 cites·10 claims
- 0932US2008049526A1Semiconductor memory device with data and local redundancy memory cell arrays, and redundancy method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1028US2005114064A1Circuit for a parallel bit test of a semiconductor memory device and method thereofFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →