Inventor · disambiguated record
David Eskeldson
Also filed as: ESKELDSON DAVID · ESKELDSON DAVID D · ESKELDSON DAVID DANIEL
12 granted patents·1 pending application·127 citations·filing 2001–2022
90Inventor score
Files withAGILENT TECHNOLOGIES INC7ADVANTEST CORP2DE LA PUENTE EDMUNDO2ADVANTEST SINGAPORE PTE LTD1VERIGY PTE LTD SINGAPORE1
Top patents by PatentIndex Score
13 records- 0191US6483284B1Wide-bandwidth probe using pole-zero cancellationAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 19, 2002·53 cites·12 claims
- 0276US8242796B2Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive unitsDE LA PUENTE EDMUNDO·Filed 2008·Granted Aug 14, 2012·7 cites·10 claims
- 0372US7257173B2Bounding box signal detectorAGILENT TECHNOLOGIES INC·Filed 2004·Granted Aug 14, 2007·17 cites·12 claims
- 0471US6864761B2Distributed capacitive/resistive electronic deviceAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 8, 2005·16 cites·4 claims
- 0565US8384410B1Parallel test circuit with active devicesADVANTEST SINGAPORE PTE LTD·Filed 2008·Granted Feb 26, 2013·4 cites·15 claims
- 0665US6901339B2Eye diagram analyzer correctly samples low dv/dt voltagesAGILENT TECHNOLOGIES INC·Filed 2003·Granted May 31, 2005·10 cites·6 claims
- 0762US6768703B2Eye diagram analyzer with fixed data channel delays and swept clock channel delayAGILENT TECHNOLOGIES INC·Filed 2002·Granted Jul 27, 2004·8 cites·4 claims
- 0860US7333311B2Method and structure for AC coupled insitu ESD protectionAGILENT TECHNOLOGIES INC·Filed 2005·Granted Feb 19, 2008·4 cites·22 claims
- 0958US6867609B2Probe for testing circuits, and associated methodsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Mar 15, 2005·8 cites·33 claims
- 1054US12259425B2Circuit and method for calibrating a plurality of automated test equipment channelsADVANTEST CORP·Filed 2022·Granted Mar 25, 2025·0 cites·19 claims
- 1145US2015015284A1Transmit/receive unit, and methods and apparatus for transmitting signals between transmit/receive unitsDE LA PUENTE EDMUNDO·Filed 2012·Application pending·0 cites
- 1243US7928755B2Methods and apparatus that selectively use or bypass a remote pin electronics block to test at least one device under testVERIGY PTE LTD SINGAPORE·Filed 2008·Granted Apr 19, 2011·0 cites·10 claims
- 1335US9087557B2Programming multiple serial input devicesADVANTEST CORP·Filed 2013·Granted Jul 21, 2015·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →