Inventor · disambiguated record
Jiunn Y. Wu
Also filed as: WU JIUNN Y · WU JIUNN-YUAN
10 granted patents·306 citations·filing 1993–1996
91Inventor score
Files withUNITED MICROELECTRONICS CORP10
Top patents by PatentIndex Score
10 records- 0190US5413962AMulti-level conductor process in VLSI fabrication utilizing an air bridgeUNITED MICROELECTRONICS CORP·Filed 1994·Granted May 9, 1995·106 cites·12 claims
- 0276US5308786ATrench isolation for both large and small areas by means of silicon nodules after metal etchingUNITED MICROELECTRONICS CORP·Filed 1993·Granted May 3, 1994·64 cites·43 claims
- 0370US5828121AMulti-level conduction structure for VLSI circuitsUNITED MICROELECTRONICS CORP·Filed 1996·Granted Oct 27, 1998·34 cites·14 claims
- 0457US5492848AStacked capacitor process using silicon nodulesUNITED MICROELECTRONICS CORP·Filed 1994·Granted Feb 20, 1996·20 cites·4 claims
- 0554US5512768ACapacitor for use in DRAM cell using surface oxidized silicon nodulesUNITED MICROELECTRONICS CORP·Filed 1994·Granted Apr 30, 1996·16 cites·1 claims
- 0653US5432073AMethod for metal deposition without poison viaUNITED MICROELECTRONICS CORP·Filed 1993·Granted Jul 11, 1995·22 cites·4 claims
- 0749US5529948ALOCOS technology with reduced junction leakageUNITED MICROELECTRONICS CORP·Filed 1994·Granted Jun 25, 1996·19 cites·22 claims
- 0848US5482882AMethod for forming most capacitor using polysilicon islandsUNITED MICROELECTRONICS CORP·Filed 1994·Granted Jan 9, 1996·15 cites·14 claims
- 0933US5668393ALocos technology with reduced junction leakageUNITED MICROELECTRONICS CORP·Filed 1996·Granted Sep 16, 1997·3 cites·7 claims
- 1030US5366925ALocal oxidation of silicon by using aluminum spiking technologyUNITED MICROELECTRONICS CORP·Filed 1993·Granted Nov 22, 1994·7 cites·28 claims
Join the waitlist — get patent alerts
Get an alert when Jiunn Y. Wu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →