Inventor · disambiguated record
Douglas G. Waltz
Also filed as: WALTZ DOUGLAS G
3 granted patents·151 citations·filing 1989–1997
77Inventor score
Top patents by PatentIndex Score
3 records- 0183US5381103ASystem and method for accelerated degradation testing of semiconductor devicesCREE RESEARCH INC·Filed 1992·Granted Jan 10, 1995·57 cites·39 claims
- 0279US5835205AOptical testing system for distinguishing a silicon carbide gemstone from a diamondC3 INC·Filed 1997·Granted Nov 10, 1998·61 cites·28 claims
- 0364US5008735APackaged diode for high temperature operationGEN INSTRUMENT CORP·Filed 1989·Granted Apr 16, 1991·33 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →