Inventor · disambiguated record
David C. Mcclure
Also filed as: MCCLURE DAVID · MCCLURE DAVID C · MCCLURE DAVID CHARLES
242 granted patents·4 pending applications·6,206 citations·filing 1989–2025
99Inventor score
Files withSGS THOMSON MICROELECTRONICS147ST MICROELECTRONICS INC94ST MICROELECTRONICS INT NV3MCCLURE DAVID C1WALSH KEVIN K1
Top patents by PatentIndex Score
246 records- 0198US5428311AFuse circuitry to control the propagation delay of an ICSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Jun 27, 1995·141 cites·6 claims
- 0295US5589783AVariable input threshold adjustmentSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Dec 31, 1996·91 cites·24 claims
- 0395US5568084ACircuit for providing a compensated bias voltageSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Oct 22, 1996·70 cites·4 claims
- 0494US6594192B1Integrated volatile and non-volatile memoryST MICROELECTRONICS INC·Filed 2000·Granted Jul 15, 2003·75 cites·17 claims
- 0594US5986914AActive hierarchical bitline memory architectureST MICROELECTRONICS INC·Filed 1995·Granted Nov 16, 1999·122 cites·61 claims
- 0693US11662205B2MEMS gyroscope control circuitST MICROELECTRONICS INC·Filed 2021·Granted May 30, 2023·2 cites·21 claims
- 0793US7362248B2Temperature tamper detection circuit and methodST MICROELECTRONICS INC·Filed 2006·Granted Apr 22, 2008·31 cites·23 claims
- 0893US5257229AColumn redundancy architecture for a read/write memorySGS THOMSON MICROELECTRONICS·Filed 1992·Granted Oct 26, 1993·121 cites·20 claims
- 0992US6006339ACircuit and method for setting the time duration of a write to a memory cellST MICROELECTRONICS INC·Filed 1998·Granted Dec 21, 1999·84 cites·8 claims
- 1092US5619462AFault detection for entire wafer stress testSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Apr 8, 1997·103 cites·39 claims
- 1192US5355340ASemiconductor memory with multiplexed redundancySGS THOMSON MICROELECTRONICS·Filed 1993·Granted Oct 11, 1994·100 cites·9 claims
- 1290US5450019APrecharging output driver circuitSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Sep 12, 1995·59 cites·23 claims
- 1390US5408435ASemiconductor memory with inhibited test mode entry during power-upSGS THOMSON MICROELECTRONICS·Filed 1992·Granted Apr 18, 1995·75 cites·13 claims
- 1490US5099148AIntegrated circuit having multiple data outputs sharing a resistor networkSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Mar 24, 1992·60 cites·29 claims
- 1589US5455798ASemiconductor memory with improved redundant sense amplifier controlSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Oct 3, 1995·62 cites·17 claims
- 1688US7623405B2SRAM with switchable power supply sets of voltagesST MICROELECTRONICS INC·Filed 2008·Granted Nov 24, 2009·20 cites·25 claims
- 1788US7443176B2Test mode and test method for a temperature tamper detection circuitST MICROELECTRONICS INC·Filed 2006·Granted Oct 28, 2008·20 cites·35 claims
- 1888US5654663ACircuit for providing a compensated bias voltageSGS THOMSON MICROELECTRONICS·Filed 1996·Granted Aug 5, 1997·47 cites·19 claims
- 1988US5485430AMultiple clocked dynamic sense amplifierSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Jan 16, 1996·63 cites·12 claims
- 2088US5455802ADual dynamic sense amplifiers for a memory arraySGS THOMSON MICROELECTRONICS·Filed 1992·Granted Oct 3, 1995·68 cites·15 claims
- 2188US5265100ASemiconductor memory with improved test modeSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Nov 23, 1993·62 cites·5 claims
- 2288US5128897ASemiconductor memory having improved latched repeaters for memory row line selectionSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Jul 7, 1992·68 cites·20 claims
- 2387US11175138B2MEMS gyroscope control circuitST MICROELECTRONICS INC·Filed 2019·Granted Nov 16, 2021·4 cites·12 claims
- 2487US5657292AWrite pass through circuitSGS THOMSON MICROELECTRONICS·Filed 1996·Granted Aug 12, 1997·68 cites·17 claims
- 2587US5424985ACompensating delay element for clock generation in a memory deviceSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Jun 13, 1995·56 cites·20 claims
- 2687US5124951ASemiconductor memory with sequenced latched row line repeatersSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Jun 23, 1992·67 cites·17 claims
- 2787US5072138ASemiconductor memory with sequential clocked access codes for test mode entrySGS THOMSON MICROELECTRONICS·Filed 1990·Granted Dec 10, 1991·62 cites·31 claims
- 2886US7688669B2Programmable SRAM source bias scheme for use with switchable SRAM power supply sets of voltagesST MICROELECTRONICS INC·Filed 2008·Granted Mar 30, 2010·18 cites·25 claims
- 2986US5629943AIntegrated circuit memory with double bitline low special test mode control from output enableSGS THOMSON MICROELECTRONICS·Filed 1994·Granted May 13, 1997·60 cites·22 claims
- 3086US5596297AOutput driver circuitry with limited output high voltageSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Jan 21, 1997·50 cites·25 claims
- 3186US5471426ARedundancy decoderSGS THOMSON MICROELECTRONICS·Filed 1992·Granted Nov 28, 1995·64 cites·2 claims
- 3286US5404331ARedundancy element check in IC memory without programming substitution of redundant elementsSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Apr 4, 1995·59 cites·19 claims
- 3385US5640122ACircuit for providing a bias voltage compensated for p-channel transistor variationsSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Jun 17, 1997·47 cites·18 claims
- 3485US5594373AOutput driver circuitry with selective limited output high voltageSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Jan 14, 1997·43 cites·21 claims
- 3585US5121358ASemiconductor memory with power-on reset controlled latched row line repeatersSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Jun 9, 1992·54 cites·13 claims
- 3684US5572470AApparatus and method for mapping a redundant memory column to a defective memory columnSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Nov 5, 1996·59 cites·26 claims
- 3784US5517455AIntegrated circuit with fuse circuitry simulating fuse blowingSGS THOMSON MICROELECTRONICS·Filed 1994·Granted May 14, 1996·52 cites·30 claims
- 3884US5339277AAddress bufferSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Aug 16, 1994·52 cites·23 claims
- 3984US5115146APower-on reset circuit for controlling test mode entrySGS THOMSON MICROELECTRONICS·Filed 1990·Granted May 19, 1992·56 cites·24 claims
- 4084US5019724ANoise tolerant input bufferSGS THOMSON MICROELECTRONICS·Filed 1989·Granted May 28, 1991·33 cites·16 claims
- 4183US6750683B2Power supply detection circuitry and methodST MICROELECTRONICS INC·Filed 2001·Granted Jun 15, 2004·28 cites·33 claims
- 4283US5841709AMemory having and method for testing redundant memory cellsST MICROELECTRONICS INC·Filed 1996·Granted Nov 24, 1998·53 cites·22 claims
- 4383US5576656AVoltage regulator for an output driver with reduced output impedanceSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Nov 19, 1996·52 cites·17 claims
- 4483US5526318ASemiconductor memory with power-on reset controlled latched row line repeatersSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Jun 11, 1996·48 cites·9 claims
- 4583US5258952ASemiconductor memory with separate time-out control for read and write operationsSGS THOMSON MICROELECTRONICS·Filed 1990·Granted Nov 2, 1993·54 cites·20 claims
- 4682US6310485B1Integrated circuit device having a burn-in mode for which entry into and exit from can be controlledST MICROELECTRONICS INC·Filed 2000·Granted Oct 30, 2001·21 cites·19 claims
- 4782US5341336AMethod for stress testing decoders and periphery circuitsSGS THOMSON MICROELECTRONICS·Filed 1993·Granted Aug 23, 1994·46 cites·27 claims
- 4881US5793247AConstant current source with reduced sensitivity to supply voltage and process variationSGS THOMSON MICROELECTRONICS·Filed 1996·Granted Aug 11, 1998·38 cites·26 claims
- 4981US5161159ASemiconductor memory with multiple clocking for test mode entrySGS THOMSON MICROELECTRONICS·Filed 1990·Granted Nov 3, 1992·49 cites·21 claims
- 5080US5579326AMethod and apparatus for programming signal timingSGS THOMSON MICROELECTRONICS·Filed 1994·Granted Nov 26, 1996·69 cites·10 claims
Showing the top 50 of 246 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →