Inventor · disambiguated record
Mari Inoue
Also filed as: INOUE MARI
4 granted patents·1 pending application·19 citations·filing 2002–2007
71Inventor score
Files withTOSHIBA KK5
Top patents by PatentIndex Score
5 records- 0171US7295304B2Mask defect inspecting method, semiconductor device manufacturing method, mask defect inspecting apparatus, defect influence map generating method, and computer program productTOSHIBA KK·Filed 2003·Granted Nov 13, 2007·12 cites·17 claims
- 0262US7821628B2Mask defect inspection computer program productTOSHIBA KK·Filed 2007·Granted Oct 26, 2010·1 cites·3 claims
- 0350US7185311B2Mask evaluating method, mask evaluating system, method of manufacturing mask and computer program productTOSHIBA KK·Filed 2004·Granted Feb 27, 2007·4 cites·15 claims
- 0444US6689625B2Method for correcting a design data of a layout pattern of a photomask, photomask manufactured by said method, and semiconductor device method using said photomaskTOSHIBA KK·Filed 2002·Granted Feb 10, 2004·2 cites·5 claims
- 0537US2004091797A1Photomask manufacturing method, photomask manufactured by said manufacturing method, and semiconductor device method using said photomaskTOSHIBA KK·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →