Inventor · disambiguated record
Junko Morikawa
Also filed as: MORIKAWA JUNKO
15 granted patents·1 pending application·80 citations·filing 1996–2023
90Inventor score
Top patents by PatentIndex Score
16 records- 0180US7883878B2Dry granulated product containing L-lysine as main componentAJINOMOTO KK·Filed 2008·Granted Feb 8, 2011·2 cites·5 claims
- 0273US7416740B2Dry granulated product containing L-lysine as main componentAJINOMOTO KK·Filed 2003·Granted Aug 26, 2008·7 cites·2 claims
- 0364US5818077AField effect transistor including a plurality of electrode units arranged in a rowNEC CORP·Filed 1996·Granted Oct 6, 1998·27 cites·17 claims
- 0460US5834802AMetal semiconductor field effect transistors having improved intermodulation distortion using different pinch-off voltagesNEC CORP·Filed 1997·Granted Nov 10, 1998·19 cites·29 claims
- 0555US12335611B2Electronic device and method for controlling the sameCANON KK·Filed 2023·Granted Jun 17, 2025·0 cites·12 claims
- 0655US12267587B2Electronic apparatus and method for controlling same to facilitate imaging mode selectionCANON KK·Filed 2023·Granted Apr 1, 2025·0 cites·10 claims
- 0750US6172384B1Field effect transistor and a method for manufacturing a sameNEC CORP·Filed 1998·Granted Jan 9, 2001·11 cites·5 claims
- 0849US12328490B2Electronic device with zoom controlCANON KK·Filed 2023·Granted Jun 10, 2025·0 cites·16 claims
- 0949US6399430B1Field effect transistor and method of manufacturing the sameNEC CORP·Filed 2000·Granted Jun 4, 2002·4 cites·13 claims
- 1044US12035066B2Image providing system and method for controlling sameCANON KK·Filed 2021·Granted Jul 9, 2024·0 cites·11 claims
- 1140US2005002435A1Method for thermal analysis and system for thermal analysisFiled 2002·Application pending·0 cites
- 1238US5677109AMethod for E-beam writingNEC CORP·Filed 1996·Granted Oct 14, 1997·7 cites·8 claims
- 1330US6417035B2Method for manufacturing a field effect transistorNEC CORP·Filed 1999·Granted Jul 9, 2002·1 cites·9 claims
- 1429US6373081B1Field effect transistor and method of fabricating the sameNEC CORP·Filed 1996·Granted Apr 16, 2002·1 cites·9 claims
- 1529US6033942AMethod of forming a metal-semiconductor field effect transistors having improved intermodulation distortion using different pinch-off voltagesNEC CORP·Filed 1998·Granted Mar 7, 2000·1 cites·29 claims
- 1628US6163041AField effect transistor and method of manufacturing the sameNEC CORP·Filed 1998·Granted Dec 19, 2000·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →