Inventor · disambiguated record
Toyokazu Nakamura
Also filed as: NAKAMURA TOYOKAZU
15 granted patents·6 pending applications·328 citations·filing 1988–2010
94Inventor score
Top patents by PatentIndex Score
21 records- 0187US5422498AApparatus for diagnosing interconnections of semiconductor integrated circuitsNEC CORP·Filed 1994·Granted Jun 6, 1995·70 cites·22 claims
- 0286US4921632ALiquid crystal compounds and compositionsNEC CORP·Filed 1988·Granted May 1, 1990·53 cites·22 claims
- 0375US8612191B2Method of generating two-wheeled vehicle dummy model and apparatus for performing a collision simulation of a two-wheeled vehicleNAMIKI HIDEO·Filed 2007·Granted Dec 17, 2013·2 cites·3 claims
- 0472US5548211ADynamic fault imaging system using electron beam and method of analyzing faultNEC CORP·Filed 1995·Granted Aug 20, 1996·41 cites·12 claims
- 0571US6971666B2Airbag apparatus for a small size vehicleHONDA MOTOR CO LTD·Filed 2003·Granted Dec 6, 2005·17 cites·18 claims
- 0664US5245259AWiper apparatus for motor vehicleJIDOSHA DENKI KOGYO KK·Filed 1992·Granted Sep 14, 1993·23 cites·7 claims
- 0761US6764099B2Shock absorbing structure for vehiclesHONDA MOTOR CO LTD·Filed 2002·Granted Jul 20, 2004·12 cites·16 claims
- 0861US5949900AFine pattern inspection device capable of carrying out inspection without pattern recognitionNEC CORP·Filed 1997·Granted Sep 7, 1999·34 cites·14 claims
- 0956US7204355B2Shock absorbing structure of two-wheeled vehicleHONDA MOTOR CO LTD·Filed 2002·Granted Apr 17, 2007·9 cites·20 claims
- 1052US7168732B2Compact vehicleHONDA MOTOR CO LTD·Filed 2003·Granted Jan 30, 2007·5 cites·22 claims
- 1150US6177681B1Apparatus method for testing opening state for hole in semiconductor deviceNEC CORP·Filed 1999·Granted Jan 23, 2001·14 cites·26 claims
- 1249US5521516ASemiconductor integrated circuit fault analyzing apparatus and method thereforNEC CORP·Filed 1994·Granted May 28, 1996·14 cites·20 claims
- 1349US2008061234A1Inspection apparatus and methodNEC ELECTRONICS CORP·Filed 2007·Application pending·0 cites
- 1448US2009236523A1Analysis apparatus and analysis method for semiconductor deviceNEC ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1547US5105129ARaindrop detection wiperJIDOSHA DENKI KOGYO KK·Filed 1991·Granted Apr 14, 1992·13 cites·3 claims
- 1647US2005091017A1Method of generating two-wheeled vehicle dummy model and apparatus for performing a collision simulation of a two-wheeled vehicleHONDA MOTOR CO LTD·Filed 2004·Application pending·0 cites
- 1744US2003117616A1Wafer external inspection apparatusNEC ELECTRONICS CORP·Filed 2002·Application pending·0 cites
- 1839US6188785B1Pattern inspecting apparatus and inspecting methodNEC CORP·Filed 1998·Granted Feb 13, 2001·11 cites·6 claims
- 1937US5703492ASystem and method for fault analysis of semiconductor integrated circuitNEC CORP·Filed 1995·Granted Dec 30, 1997·10 cites·21 claims
- 2037US2001002700A1Apparatus for optically checking a pattern and method of doing the sameNEC CORP·Filed 2000·Application pending·0 cites
- 2132US2011025340A1Semiconductor device analyzer and semiconductor device analysis methodNEC ELECTRONICS CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →