Inventor · disambiguated record
Kent J. Gillig
Also filed as: GILLIG KENT J · GILLIG KENT JAMES
8 granted patents·160 citations·filing 2001–2018
87Inventor score
Files withIONWERKS2IONWERKS INC2SHIMADZU RES LABORATORY SHANGHAI CO LTD2ACADEMIA SINICA1TEXAS A & M UNIV SYS1
Top patents by PatentIndex Score
8 records- 0191US6897437B2Mobility spectrometerIONWERKS·Filed 2001·Granted May 24, 2005·40 cites·106 claims
- 0291US6683299B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS·Filed 2002·Granted Jan 27, 2004·47 cites·20 claims
- 0391US6639213B2Periodic field focusing ion mobility spectrometerTEXAS A & M UNIV SYS·Filed 2001·Granted Oct 28, 2003·41 cites·27 claims
- 0480US7084395B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS INC·Filed 2004·Granted Aug 1, 2006·16 cites·34 claims
- 0578US9324552B2Periodic field differential mobility analyzerACADEMIA SINICA·Filed 2012·Granted Apr 26, 2016·3 cites·36 claims
- 0675US11164735B2Ion migration rate analysis device and analysis method appliedSHIMADZU RES LABORATORY SHANGHAI CO LTD·Filed 2018·Granted Nov 2, 2021·1 cites·15 claims
- 0774US7019286B2Time-of-flight mass spectrometer for monitoring of fast processesIONWERKS INC·Filed 2003·Granted Mar 28, 2006·12 cites·14 claims
- 0839US10739308B2Ion mobility analyzer and analysis methodSHIMADZU RES LABORATORY(SHANGHAI) CO LTD·Filed 2018·Granted Aug 11, 2020·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →