Inventor · disambiguated record
Yoshihiko Okamoto
Also filed as: OKAMOTO YOSHIHIKO
63 granted patents·7 pending applications·1,181 citations·filing 1974–2022
99Inventor score
Top patents by PatentIndex Score
70 records- 0199US5045417AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1989·Granted Sep 3, 1991·197 cites·37 claims
- 0295US5352550AMask for manufacturing semiconductor devices and method of manufacture thereofHITACHI LTD·Filed 1993·Granted Oct 4, 1994·62 cites·24 claims
- 0393US5298365AProcess for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 1993·Granted Mar 29, 1994·59 cites·7 claims
- 0490US4417260AImage scanning systemFUJI PHOTO FILM CO LTD·Filed 1982·Granted Nov 22, 1983·55 cites·8 claims
- 0588US5386623AProcess for manufacturing a multi-chip moduleHITACHI LTD·Filed 1991·Granted Feb 7, 1995·101 cites·22 claims
- 0686US5418092AProcess for manufacturing semiconductor integrated circuit device, exposure method and mask for the processHITACHI LTD·Filed 1992·Granted May 23, 1995·82 cites·28 claims
- 0785US10749379B2Power supply apparatus and control method thereofCANON KK·Filed 2018·Granted Aug 18, 2020·4 cites·21 claims
- 0884US5502001AMethod of forming light beam and method of fabricating semiconductor integrated circuitsHITACHI LTD·Filed 1994·Granted Mar 26, 1996·54 cites·11 claims
- 0982US5306585AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1993·Granted Apr 26, 1994·19 cites·6 claims
- 1079US4410799ADevice for controlling radiation image information read out gainFUJI PHOTO FILM CO LTD·Filed 1981·Granted Oct 18, 1983·41 cites·5 claims
- 1176US5786112APhotomask manufacturing process and semiconductor integrated circuit device manufacturing process using the photomaskHITACHI LTD·Filed 1996·Granted Jul 28, 1998·37 cites·17 claims
- 1276US4278347ACathode-ray tube image recording deviceFUJI PHOTO FILM CO LTD·Filed 1980·Granted Jul 14, 1981·24 cites·7 claims
- 1375US10511190B2Power transmission apparatus wirelessly transmitting power to power receiving apparatusCANON KK·Filed 2016·Granted Dec 17, 2019·2 cites·10 claims
- 1475US4120722AThermal development of imaged light-sensitive recording material using microwavesFUJI PHOTO FILM CO LTD·Filed 1977·Granted Oct 17, 1978·10 cites·5 claims
- 1574US6309800B1Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 2000·Granted Oct 30, 2001·9 cites·4 claims
- 1674US5455144AProcess for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 1994·Granted Oct 3, 1995·19 cites·3 claims
- 1774US5358807AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1993·Granted Oct 25, 1994·12 cites·118 claims
- 1873US5973785AMethod of forming light beam, apparatus therefor, method of measuring sizes using the same, method of inspecting appearance, method of measuring height, method of exposure, and method of fabricating semiconductor integrated circuitsHITACHI LTD·Filed 1995·Granted Oct 26, 1999·34 cites·22 claims
- 1972US6420075B1Mask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 2001·Granted Jul 16, 2002·12 cites·1 claims
- 2072US5411823AExposure method, phase shift mask used in the same, and process of fabricating semiconductor integrated circuit device using the sameHITACHI LTD·Filed 1993·Granted May 2, 1995·26 cites·20 claims
- 2171US5667941AProcess for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 1995·Granted Sep 16, 1997·17 cites·23 claims
- 2270US6284414B1Mask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 2000·Granted Sep 4, 2001·4 cites·15 claims
- 2370US6153357AProcess for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 1997·Granted Nov 28, 2000·16 cites·85 claims
- 2470US5753416AProcess for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processHITACHI LTD·Filed 1995·Granted May 19, 1998·16 cites·20 claims
- 2570US3938164ADevice for thermally recording a cathode-ray tube imageFUJI PHOTO FILM CO LTD·Filed 1974·Granted Feb 10, 1976·15 cites·4 claims
- 2669US10886787B2Power supply apparatus capable of supplying power to multiple power receiving apparatuses, control method thereof, and storage mediumCANON KK·Filed 2018·Granted Jan 5, 2021·2 cites·16 claims
- 2767US5691115AExposure method, aligner, and method of manufacturing semiconductor integrated circuit devicesHITACHI LTD·Filed 1995·Granted Nov 25, 1997·19 cites·15 claims
- 2866US7008736B2Semiconductor integrated circuit device fabrication method using a mask having a phase shifting film covering region and an opening regionRENESAS TECH CORP·Filed 2003·Granted Mar 7, 2006·3 cites·6 claims
- 2964US12364380B2Information processing apparatus, method for controlling the same, and storage medium storing program thereforCANON KK·Filed 2022·Granted Jul 22, 2025·0 cites·22 claims
- 3063US5837423ASemiconductor IC device fabricating methodHITACHI LTD·Filed 1997·Granted Nov 17, 1998·23 cites·22 claims
- 3163US5757409AExposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatusHITACHI LTD·Filed 1996·Granted May 26, 1998·25 cites·43 claims
- 3262US6432790B1Method of manufacturing photomask, photomask, and method of manufacturing semiconductor integrated circuit deviceHITACHI LTD·Filed 2001·Granted Aug 13, 2002·12 cites·26 claims
- 3359US6794118B2Process for fabricating semiconductor integrated circuit device, and exposing system and mask inspecting method to be used in the processRENESAS TECH CORP·Filed 2001·Granted Sep 21, 2004·4 cites·1 claims
- 3459US5641715ASemiconductor IC device fabricating methodHITACHI LTD·Filed 1995·Granted Jun 24, 1997·21 cites·22 claims
- 3559US2023416495A1Negative thermal expansion material, composite material, method of manufacturing negative thermal expansion material, and component made of negative thermal expansion materialNATIONAL UNIV CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM·Filed 2021·Application pending·0 cites
- 3658US5830606AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1997·Granted Nov 3, 1998·7 cites·20 claims
- 3758US5484671AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1994·Granted Jan 16, 1996·7 cites·47 claims
- 3857US12354359B2Information processing system, control method of the system, and storage mediumCANON KK·Filed 2022·Granted Jul 8, 2025·0 cites·19 claims
- 3956US6020109AExposure method, aligner, and method of manufacturing semiconductor integrated circuit devicesHITACHI LTD·Filed 1999·Granted Feb 1, 2000·11 cites·40 claims
- 4055US6733933B2Mask for manufacturing semiconductor device and method of manufacture thereofRENESAS TECH CORP·Filed 2003·Granted May 11, 2004·1 cites·2 claims
- 4153US5557314AExposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatusHITACHI LTD·Filed 1993·Granted Sep 17, 1996·20 cites·17 claims
- 4252US2009208695A1Spun-dyed, crimped polylactic acid fiber, method for manufacture thereof, and carpetSUMINOE TEXTILE·Filed 2006·Application pending·0 cites
- 4351US5311026ACharged particle beam lithography system and method thereforHITACHI LTD·Filed 1992·Granted May 10, 1994·9 cites·11 claims
- 4450US7304001B2Fabrication methods of semiconductor integrated circuit device and photomaskRENESAS TECH CORP·Filed 2002·Granted Dec 4, 2007·4 cites·6 claims
- 4550US5902705AExposure method, aligner, and method manufacturing semiconductor integrated circuit devicesHITACHI LTD·Filed 1997·Granted May 11, 1999·8 cites·30 claims
- 4650US5521033AProcess for manufacturing semiconductor integrated circuit device, exposure method and mask for the processHITACHI LTD·Filed 1995·Granted May 28, 1996·13 cites·13 claims
- 4750US4975580ARadiation image read-out and reproducing apparatusFUJI PHOTO FILM CO LTD·Filed 1988·Granted Dec 4, 1990·11 cites·28 claims
- 4848US10676371B2Ruthenium oxide having a negative thermal expansion coefficient, and useable as a thermal expansion inhibitorUNIV NAGOYA NAT UNIV CORP·Filed 2017·Granted Jun 9, 2020·0 cites·18 claims
- 4948US5948574AMask for manufacturing semiconductor device and method of manufacture thereofHITACHI LTD·Filed 1998·Granted Sep 7, 1999·5 cites·18 claims
- 5048US5654230AMethod of forming doped filmTOKYO ELECTRON LTD·Filed 1995·Granted Aug 5, 1997·17 cites·8 claims
Showing the top 50 of 70 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →