Inventor · disambiguated record
David A. Kidd
Also filed as: KIDD DAVID · KIDD DAVID A · KIDD DAVID ANTHONY · KIDD DAVID L
32 granted patents·4 pending applications·276 citations·filing 1990–2021
97Inventor score
Top patents by PatentIndex Score
36 records- 0196US9112484B1Integrated circuit process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 18, 2015·25 cites·16 claims
- 0294US8816754B1Body bias circuits and methodsSUVOLTA INC·Filed 2012·Granted Aug 26, 2014·23 cites·6 claims
- 0389US11139802B1Sequential based ring oscillatorQUALCOMM INC·Filed 2020·Granted Oct 5, 2021·3 cites·28 claims
- 0489US9612281B2High-speed flip-flop with robust scan-in path hold timeQUALCOMM INC·Filed 2014·Granted Apr 4, 2017·10 cites·23 claims
- 0589US5210364AProcess for the preparation of branched olefinsBRITISH PETROLEUM CO·Filed 1991·Granted May 11, 1993·31 cites·8 claims
- 0688US9112495B1Integrated circuit device body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Aug 18, 2015·9 cites·21 claims
- 0786US5354930AProcess for converting polymers by contacting same with particulate material suspended in a toroidal shapeBP CHEM INT LTD·Filed 1993·Granted Oct 11, 1994·48 cites·11 claims
- 0885US9953974B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2017·Granted Apr 24, 2018·3 cites·12 claims
- 0985US9583484B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Feb 28, 2017·3 cites·11 claims
- 1085US7895530B2User definable interface system, method, support tools, and computer program productCHANGE TOOLS INC·Filed 2004·Granted Feb 22, 2011·52 cites·17 claims
- 1183US8863064B1SRAM cell layout structure and devices therefromSUVOLTA INC·Filed 2013·Granted Oct 14, 2014·8 cites·6 claims
- 1282US9093997B1Slew based process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jul 28, 2015·4 cites·15 claims
- 1378US9853019B2Integrated circuit device body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2016·Granted Dec 26, 2017·2 cites·3 claims
- 1477US9319034B2Slew based process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Apr 19, 2016·2 cites·13 claims
- 1575US8895327B1Tipless transistors, short-tip transistors, and methods and circuits thereforSUVOLTA INC·Filed 2012·Granted Nov 25, 2014·2 cites·20 claims
- 1673US9424385B1SRAM cell layout structure and devices therefromMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Aug 23, 2016·3 cites·17 claims
- 1772US11145647B2Tipless transistors, short-tip transistors, and methods and circuits thereforUNITED SEMICONDUCTOR JAPAN CO LTD·Filed 2020·Granted Oct 12, 2021·0 cites·12 claims
- 1868US9276561B2Integrated circuit process and bias monitors and related methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Mar 1, 2016·1 cites·2 claims
- 1966US7000206B2Timing path detailerBROADCOM CORP·Filed 2004·Granted Feb 14, 2006·10 cites·6 claims
- 2059US9154123B1Body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Oct 6, 2015·1 cites·16 claims
- 2158US10573644B2Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2018·Granted Feb 25, 2020·0 cites·12 claims
- 2257US6834379B2Timing path detailerBROADCOM CORP·Filed 2002·Granted Dec 21, 2004·5 cites·14 claims
- 2354US9385121B1Tipless transistors, short-tip transistors, and methods and circuits thereforMIE FUJITSU SEMICONDUCTOR LTD·Filed 2014·Granted Jul 5, 2016·0 cites·19 claims
- 2454US5582118ARemoval of organic contaminants from solid particlesTORFTECH LTD·Filed 1994·Granted Dec 10, 1996·26 cites·22 claims
- 2552US9548086B2Integrated circuit device body bias circuits and methodsMIE FUJITSU SEMICONDUCTOR LTD·Filed 2015·Granted Jan 17, 2017·0 cites·2 claims
- 2650US9013851B2Inrush current control circuit and method for utilizing sameKIDD DAVID ANTHONY·Filed 2010·Granted Apr 21, 2015·1 cites·20 claims
- 2749US11823962B2Back end of line (BEOL) process corner sensingQUALCOMM INC·Filed 2021·Granted Nov 21, 2023·0 cites·22 claims
- 2849US11011459B1Back-end-of-line (BEOL) on-chip sensorQUALCOMM INC·Filed 2020·Granted May 18, 2021·0 cites·20 claims
- 2945US6877147B2Technique to assess timing delay by use of layout quality analyzer comparisonBROADCOM CORP·Filed 2002·Granted Apr 5, 2005·2 cites·7 claims
- 3042US9824174B2Power-density-based clock cell spacingQUALCOMM INC·Filed 2015·Granted Nov 21, 2017·0 cites·30 claims
- 3142US2003216993A1System, method and computer program product for providing online service contract negotiation serviceFiled 2002·Application pending·0 cites
- 3239US8976575B1SRAM performance monitorSUVOLTA INC·Filed 2013·Granted Mar 10, 2015·0 cites·19 claims
- 3338US2005132318A1Layout quality analyzerFiled 2005·Application pending·0 cites
- 3435US2006197961A1Portable photographic printing method and apparatusKIDD DAVID L·Filed 2005·Application pending·0 cites
- 3534US5081195AHydrolysis of polymersBP CHEM INT LTD·Filed 1990·Granted Jan 14, 1992·2 cites·8 claims
- 3634US2019107569A1Digital current measurement for in-situ device monitoringQUALCOMM INC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →