Inventor · disambiguated record
Tho Le La
Also filed as: LA THO L · LA THO LE
8 granted patents·383 citations·filing 1995–2019
88Inventor score
Top patents by PatentIndex Score
8 records- 0195US5761064ADefect management system for productivity and yield improvementADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 2, 1998·243 cites·40 claims
- 0291US6507942B1Methods and circuits for testing a circuit fabrication process for device uniformityXILINX INC·Filed 2000·Granted Jan 14, 2003·79 cites·26 claims
- 0354US5780204ABackside wafer polishing for improved photolithographyADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 14, 1998·19 cites·22 claims
- 0452US6072191AInterlevel dielectric thickness monitor for complex semiconductor chipsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jun 6, 2000·15 cites·7 claims
- 0551US6403385B1Method of inspecting a semiconductor wafer for defectsADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 11, 2002·18 cites·24 claims
- 0649US6350627B1Interlevel dielectric thickness monitor for complex semiconductor chipsADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 26, 2002·2 cites·7 claims
- 0747US11385287B1Method for adaptively utilizing programmable logic devicesXILINX INC·Filed 2019·Granted Jul 12, 2022·0 cites·20 claims
- 0838US6136510ADoubled-sided wafer scrubbing for improved photolithographyADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 24, 2000·7 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →