Inventor · disambiguated record
Christian Musshoff
Also filed as: MUSSHOFF CHRISTIAN
3 granted patents·2 citations·filing 2005–2016
52Inventor score
Technology areasG01R
Files withINFINEON TECHNOLOGIES AG3
Top patents by PatentIndex Score
3 records- 0153US10018667B2Method for testing semiconductor diesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jul 10, 2018·0 cites·13 claims
- 0251US7265564B2Method for testing a contact region of a semiconductor moduleINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 4, 2007·2 cites·39 claims
- 0350US9435849B2Method for testing semiconductor dies and a test apparatusINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 6, 2016·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →