Inventor · disambiguated record
Michael Leutschacher
Also filed as: LEUTSCHACHER MICHAEL
4 granted patents·0 citations·filing 2014–2017
54Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0153US10018667B2Method for testing semiconductor diesINFINEON TECHNOLOGIES AG·Filed 2016·Granted Jul 10, 2018·0 cites·13 claims
- 0250US9435849B2Method for testing semiconductor dies and a test apparatusINFINEON TECHNOLOGIES AG·Filed 2014·Granted Sep 6, 2016·0 cites·4 claims
- 0341US10073133B2Current distribution device protected against over-voltage conditionsINFINEON TECHNOLOGIES AG·Filed 2017·Granted Sep 11, 2018·0 cites·17 claims
- 0435US9933476B2Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection nodeINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2015·Granted Apr 3, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →