Inventor · disambiguated record
Victoria J. Bruce
Also filed as: BRUCE VICTORIA · BRUCE VICTORIA J · BRUCE VICTORIA JEAN
26 granted patents·1 pending application·782 citations·filing 1992–2016
97Inventor score
Top patents by PatentIndex Score
27 records- 0197US6617862B1Laser intrusive technique for locating specific integrated circuit current pathsADVANCED MICRO DEVICES INC·Filed 2002·Granted Sep 9, 2003·112 cites·18 claims
- 0297US6549022B1Apparatus and method for analyzing functional failures in integrated circuitsSANDIA CORP·Filed 2000·Granted Apr 15, 2003·187 cites·55 claims
- 0395US6483327B1Quadrant avalanche photodiode time-resolved detectionADVANCED MICRO DEVICES INC·Filed 1999·Granted Nov 19, 2002·123 cites·22 claims
- 0481US9354185B23D imaging with multiple irradiation frequenciesADVANCED MICRO DEVICES INC·Filed 2012·Granted May 31, 2016·7 cites·7 claims
- 0579US7088852B1Three-dimensional tomographyADVANCED MICRO DEVICES INC·Filed 2001·Granted Aug 8, 2006·16 cites·13 claims
- 0679US6300148B1Semiconductor structure with a backside protective layer and backside probes and a method for constructing the structureADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 9, 2001·49 cites·24 claims
- 0778US6375347B1Method for laser scanning flip-chip integrated circuitsADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 23, 2002·21 cites·19 claims
- 0878US6107107AAnalyzing an electronic circuit formed upon a frontside surface of a semiconductor substrate by detecting radiation exiting a backside surface coated with an antireflective materialADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 22, 2000·62 cites·33 claims
- 0974US5301006AEmission microscopeADVANCED MICRO DEVICES INC·Filed 1992·Granted Apr 5, 1994·40 cites·9 claims
- 1072US6069366AEndpoint detection for thinning of silicon of a flip chip bonded integrated circuitADVANCED MICRO DEVICES INC·Filed 1998·Granted May 30, 2000·27 cites·29 claims
- 1166US6146014AMethod for laser scanning flip-chip integrated circuitsADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·23 cites·25 claims
- 1266US5661520AEnergy resolved emission microscopy system and methodFiled 1994·Granted Aug 26, 1997·25 cites·20 claims
- 1364US6546513B1Data processing device test apparatus and method thereforADVANCED MICRO DEVICES INC·Filed 2000·Granted Apr 8, 2003·11 cites·26 claims
- 1462US6285036B1Endpoint detection for thinning of silicon of a flip chip bonded integrated circuitADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 4, 2001·8 cites·10 claims
- 1560US6844928B1Fiber optic semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Jan 18, 2005·3 cites·19 claims
- 1660US6714294B1De broglie microscopeADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 30, 2004·2 cites·49 claims
- 1756US7062399B1Resistivity analysisADVANCED MICRO DEVICES INC·Filed 2000·Granted Jun 13, 2006·9 cites·23 claims
- 1856US6210981B1Method for etching a flip chip using secondary particle emissions to detect the etch end-pointADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 3, 2001·20 cites·14 claims
- 1953US6700659B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Mar 2, 2004·6 cites·33 claims
- 2050US6417068B1Semiconductor device navigation using laser scribingADVANCE MICRO DEVICES INC·Filed 1999·Granted Jul 9, 2002·13 cites·15 claims
- 2148US6635839B1Semiconductor analysis arrangement and method thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Oct 21, 2003·4 cites·23 claims
- 2247US6870379B1Indirect stimulation of an integrated circuit dieADVANCED MICRO DEVICES INC·Filed 2002·Granted Mar 22, 2005·3 cites·26 claims
- 2338US2017176520A1Tunable wavelength electro-optical analyzerQUALCOMM INC·Filed 2016·Application pending·0 cites
- 2437US6545490B1Trench-filled probe point for a semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 8, 2003·6 cites·18 claims
- 2530US6350982B1Inducement and detection of latch-up using a laser scanning microscopeADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 26, 2002·0 cites·17 claims
- 2629US6410349B1Internal anti-reflective coating for interference reductionADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 25, 2002·1 cites·22 claims
- 2726US6348364B1Navigation using 3-D detectable patternADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 19, 2002·4 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →