Inventor · disambiguated record
Masayuki Kajiwara
Also filed as: KAJIWARA MASAYUKI
22 granted patents·2 pending applications·358 citations·filing 2001–2020
96Inventor score
Top patents by PatentIndex Score
24 records- 0194US6913956B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Jul 5, 2005·62 cites·127 claims
- 0291US7501671B2Semiconductor device and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2007·Granted Mar 10, 2009·13 cites·20 claims
- 0391US7045444B2Method of manufacturing semiconductor device that includes selectively adding a noble gas elementSEMICONDUCTOR ENERGY LAB·Filed 2001·Granted May 16, 2006·47 cites·44 claims
- 0491US7033871B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Apr 25, 2006·14 cites·8 claims
- 0590US7115453B2Semiconductor device and manufacturing method of the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Oct 3, 2006·42 cites·70 claims
- 0690US6858480B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Feb 22, 2005·37 cites·55 claims
- 0789US6808968B2Method of manufacturing a semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Oct 26, 2004·37 cites·73 claims
- 0884US7605029B2Method of manufacturing semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Oct 20, 2009·7 cites·18 claims
- 0983US7141822B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Nov 28, 2006·24 cites·38 claims
- 1081US9246009B2Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Jan 26, 2016·3 cites·17 claims
- 1180US7316947B2Method of manufacturing a semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Jan 8, 2008·23 cites·39 claims
- 1280US7306982B2Method of manufacturing a semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2004·Granted Dec 11, 2007·19 cites·105 claims
- 1377US9006051B2Semiconductor device and method for manufacturing the sameOIKAWA YOSHIAKI·Filed 2009·Granted Apr 14, 2015·6 cites·10 claims
- 1476US7821005B2Method of manufacturing semiconductor device and semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Oct 26, 2010·4 cites·18 claims
- 1573US7709894B2Semiconductor device including a transistor with a gate electrode having a taper portionSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted May 4, 2010·4 cites·24 claims
- 1670US10807027B2Treatment solution supply apparatus and substrate treatment systemTOKYO ELECTRON LTD·Filed 2018·Granted Oct 20, 2020·1 cites·10 claims
- 1765US7198992B2Method of manufacturing a semiconductor device comprising doping steps using gate electrodes and resists as masksSEMICONDUCTOR ENERGY LAB·Filed 2004·Granted Apr 3, 2007·7 cites·11 claims
- 1860US7151016B2Method of manufacturing a semiconductor device that includes a hydrogen concentration depth profileSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Dec 19, 2006·8 cites·48 claims
- 1953US10023477B2Treatment solution supply method, treatment solution supply apparatus, and non-transitory computer-readable recording mediumTOKYO ELECTRON LTD·Filed 2015·Granted Jul 17, 2018·0 cites·15 claims
- 2051US2007037309A1Semiconductor device and method for manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2006·Application pending·0 cites
- 2149US7538011B2Method of manufacturing a semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2007·Granted May 26, 2009·0 cites·42 claims
- 2249US7534670B2Semiconductor device and manufacturing method of the sameSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted May 19, 2009·0 cites·32 claims
- 2337US12094737B2Substrate processing apparatus, control method, and computer-readable storage mediumTOKYO ELECTRON LTD·Filed 2020·Granted Sep 17, 2024·0 cites·12 claims
- 2435US2003178682A1Semiconductor device and method of manufacturing the semiconductor deviceFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →