Inventor · disambiguated record
Jouke Krist
Also filed as: KRIST JOUKE
2 granted patents·30 citations·filing 2008–2013
58Inventor score
Top patents by PatentIndex Score
2 records- 0187US8868387B2Method of optimizing a model, a method of measuring a property, a device manufacturing method, a spectrometer and a lithographic apparatusDEN BOEF ARIE JEFFREY·Filed 2008·Granted Oct 21, 2014·28 cites·40 claims
- 0273US9518936B2Method and apparatus for determining lithographic quality of a structureASML NETHERLANDS BV·Filed 2013·Granted Dec 13, 2016·2 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →