Inventor · disambiguated record
Jack E. Weimer
Also filed as: WEIMER JACK · WEIMER JACK E · WEIMER JACK EDWARD
7 granted patents·38 citations·filing 2002–2019
81Inventor score
Top patents by PatentIndex Score
7 records- 0174US10698020B2Current regulation for accurate and low-cost voltage measurements at the wafer levelTERADYNE INC·Filed 2014·Granted Jun 30, 2020·3 cites·34 claims
- 0272US6759842B2Interface adapter for automatic test systemsEAGLE TEST SYSTEMS INC·Filed 2002·Granted Jul 6, 2004·20 cites·15 claims
- 0365US7561083B2Testing of analog to digital convertersEAGLE TEST SYSTEMS INC·Filed 2007·Granted Jul 14, 2009·6 cites·19 claims
- 0463US11067629B2Automated test equipment for testing high-power electronic componentsTERADYNE INC·Filed 2019·Granted Jul 20, 2021·1 cites·24 claims
- 0554US9989584B2Controlling signal path inductance in automatic test equipmentTERADYNE INC·Filed 2014·Granted Jun 5, 2018·1 cites·20 claims
- 0647US11041900B2Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer levelTERADYNE INC·Filed 2014·Granted Jun 22, 2021·0 cites·25 claims
- 0746US6697753B2Methods and apparatus for testing electronic devicesEAGLE TEST SYSTEMS INC·Filed 2002·Granted Feb 24, 2004·7 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →