Inventor · disambiguated record
Takayuki Abe
Also filed as: ABE TAKAYUKI
132 granted patents·31 pending applications·1,071 citations·filing 1985–2024
99Inventor score
Top patents by PatentIndex Score
163 records- 0198US9705003B2Semiconductor device including first and second gate electrodes and stack of insulating layersSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Jul 11, 2017·24 cites·27 claims
- 0298US9012918B2Semiconductor device including oxide semiconductorYAMAZAKI SHUNPEI·Filed 2010·Granted Apr 21, 2015·47 cites·13 claims
- 0395US10804487B2Light-emitting deviceSEMICONDUCTOR ENERGY LAB·Filed 2018·Granted Oct 13, 2020·6 cites·20 claims
- 0495US6333138B1Exposure method utilizing partial exposure stitch areaTOSHIBA KK·Filed 2000·Granted Dec 25, 2001·76 cites·8 claims
- 0593US9899626B2Light-emitting deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted Feb 20, 2018·6 cites·20 claims
- 0693US7601968B2Charged particle beam writing method and apparatusNUFLARE TECHNOLOGY INC·Filed 2006·Granted Oct 13, 2009·19 cites·15 claims
- 0793US5863682ACharged particle beam writing method for determining optimal exposure dose prior to pattern drawingTOSHIBA KK·Filed 1997·Granted Jan 26, 1999·107 cites·20 claims
- 0892US11383540B2Printing apparatusPANASONIC IP MAN CO LTD·Filed 2020·Granted Jul 12, 2022·2 cites·16 claims
- 0991US11858485B2Straddle type vehicle, vehicle control apparatus, vehicle control method, and non-transitory computer-readable storage mediumHONDA MOTOR CO LTD·Filed 2021·Granted Jan 2, 2024·2 cites·15 claims
- 1091US9960213B2Input and output device having touch sensor element as input device and display deviceSEMICONDUCTOR ENERGY LAB·Filed 2015·Granted May 1, 2018·8 cites·19 claims
- 1191US8737676B2Defect estimation device and method and inspection system and methodTSUCHIYA HIDEO·Filed 2011·Granted May 27, 2014·13 cites·2 claims
- 1291US7740991B2Beam dose computing method and writing method and record carrier body and writing apparatus for determining an optimal dose of a charged particle beamNUFLARE TECHNOLOGY INC·Filed 2006·Granted Jun 22, 2010·19 cites·18 claims
- 1391US7525110B2Multiple irradiation effect-corrected dose determination technique for charged particle beam lithographyNUFLARE TECHNOLOGY INC·Filed 2007·Granted Apr 28, 2009·14 cites·17 claims
- 1491US7511290B2Charged particle beam writing method and apparatusNUFLARE TECHNOLOGY INC·Filed 2007·Granted Mar 31, 2009·16 cites·19 claims
- 1590US9868486B2Saddle-ride type vehicleHONDA MOTOR CO LTD·Filed 2016·Granted Jan 16, 2018·7 cites·10 claims
- 1690US8352889B2Beam dose computing method and writing method and record carrier body and writing apparatusNUFLARE TECHNOLOGY INC·Filed 2011·Granted Jan 8, 2013·5 cites·5 claims
- 1790US8065635B2Method for resizing pattern to be written by lithography technique, and charged particle beam writing methodYASHIMA JUN·Filed 2007·Granted Nov 22, 2011·10 cites·4 claims
- 1890US7662522B2Method for manufacturing semiconductor devices, and method for forming a pattern onto an exposure maskNUFLARE TECHNOLOGY INC·Filed 2008·Granted Feb 16, 2010·11 cites·12 claims
- 1990US5008553AElectron beam lithography method and apparatusTOSHIBA KK·Filed 1989·Granted Apr 16, 1991·44 cites·19 claims
- 2089US6047116AMethod for generating exposure data for lithographic apparatusTOSHIBA KK·Filed 1998·Granted Apr 4, 2000·62 cites·11 claims
- 2188US9177372B2Defect estimation device and method and inspection system and methodNUFLARE TECHNOLOGY INC·Filed 2015·Granted Nov 3, 2015·5 cites·4 claims
- 2288US8122390B2Charged particle beam writing apparatus, and apparatus and method for correcting dimension error of patternYASHIMA JUN·Filed 2009·Granted Feb 21, 2012·10 cites·10 claims
- 2388US7863586B2Writing data creation method and charged particle beam writing apparatusNUFLARE TECHNOLOGY INC·Filed 2008·Granted Jan 4, 2011·10 cites·9 claims
- 2487US7669174B2Pattern generation method and charged particle beam writing apparatusNUFLARE TECHNOLOGY INC·Filed 2007·Granted Feb 23, 2010·10 cites·11 claims
- 2586US8781212B2Defect estimation device and method and inspection system and methodNUFLARE TECHNOLOGY INC·Filed 2012·Granted Jul 15, 2014·6 cites·3 claims
- 2686US8309283B2Method and apparatus for writingKATO YASUO·Filed 2009·Granted Nov 13, 2012·13 cites·9 claims
- 2786US7973918B2Apparatus and method for pattern inspectionNUFLARE TECHNOLOGY INC·Filed 2009·Granted Jul 5, 2011·10 cites·4 claims
- 2886US7619230B2Charged particle beam writing method and apparatus and readable storage mediumNUFLARE TECHNOLOGY INC·Filed 2006·Granted Nov 17, 2009·10 cites·15 claims
- 2986US6313476B1Charged beam lithography systemTOSHIBA KK·Filed 1999·Granted Nov 6, 2001·56 cites·12 claims
- 3084US11072450B2Laminated bottleFURUSAWA MITSUO·Filed 2019·Granted Jul 27, 2021·2 cites·7 claims
- 3184US8684235B2Trigger-type liquid sprayerINABA SHINICHI·Filed 2008·Granted Apr 1, 2014·19 cites·7 claims
- 3284US7919905B2Magnetic head actuator having conductive fastening member electrically connecting upper and lower piezoelectric elementsSONY CORP·Filed 2007·Granted Apr 5, 2011·5 cites·5 claims
- 3384US7608845B2Charged particle beam writing apparatus and method thereof, and method for resizing dimension variation due to loading effectNUFLARE TECHNOLOGY INC·Filed 2007·Granted Oct 27, 2009·11 cites·9 claims
- 3483US10592772B2Image capturing attachment tool, work management method, system, comparison device, and programNEC CORP·Filed 2016·Granted Mar 17, 2020·3 cites·17 claims
- 3582US8080809B2Charged particle beam writing apparatus and method thereofABE TAKAYUKI·Filed 2008·Granted Dec 20, 2011·6 cites·4 claims
- 3682US7872745B2Pattern inspection apparatus and pattern inspection methodNUFLARE TECHNOLOGY INC·Filed 2008·Granted Jan 18, 2011·9 cites·8 claims
- 3781US7847549B2Magnetic resonance imaging apparatusHITACHI MEDICAL CORP·Filed 2006·Granted Dec 7, 2010·11 cites·20 claims
- 3880US7759659B2Charged particle beam writing methodNUFLARE TECHNOLOGY INC·Filed 2008·Granted Jul 20, 2010·5 cites·9 claims
- 3979US8429575B2Method for resizing pattern to be written by lithography technique, and charged particle beam writing methodYASHIMA JUN·Filed 2011·Granted Apr 23, 2013·3 cites·2 claims
- 4079US6172364B1Charged particle beam irradiation apparatusTOSHIBA KK·Filed 1998·Granted Jan 9, 2001·31 cites·15 claims
- 4178US8040134B2Magnetic resonance imaging device configured to suppress signals from fat by excluding effect of non-uniformity of irradiated magnetic fieldHITACHI MEDICAL CORP·Filed 2007·Granted Oct 18, 2011·7 cites·21 claims
- 4277US9935583B2Power amplifier circuitPANASONIC CORP·Filed 2017·Granted Apr 3, 2018·3 cites·5 claims
- 4377US9203364B2DC offset cancellerPANASONIC CORP·Filed 2014·Granted Dec 1, 2015·6 cites·20 claims
- 4477US8103980B2Beam dose computing method and writing method and record carrier body and writing apparatusEMI KEIKO·Filed 2009·Granted Jan 24, 2012·8 cites·6 claims
- 4576US9505446B2Powertrain unitTOYOTA MOTOR CO LTD·Filed 2016·Granted Nov 29, 2016·3 cites·7 claims
- 4676US7928414B2Charged particle beam writing apparatus and charged particle beam writing methodNUFLARE TECHNOLOGY INC·Filed 2008·Granted Apr 19, 2011·3 cites·13 claims
- 4776US7705321B2Charged particle beam writing apparatus and methodNUFLARE TECHNOLOGY INC·Filed 2008·Granted Apr 27, 2010·3 cites·10 claims
- 4875US9406573B2Exposure mask fabrication method, exposure mask fabrication system, and semiconductor device fabrication methodNUFLARE TECHNOLOGY INC·Filed 2015·Granted Aug 2, 2016·2 cites·12 claims
- 4975US9122176B2Method for fabricating semiconductor device, pattern writing apparatus, recording medium recording program, and pattern transfer apparatusABE TAKAYUKI·Filed 2012·Granted Sep 1, 2015·2 cites·6 claims
- 5075US8153996B2Pattern forming apparatus and pattern forming methodABE TAKAYUKI·Filed 2009·Granted Apr 10, 2012·5 cites·3 claims
Showing the top 50 of 163 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →