Inventor · disambiguated record

Seung Hwa Oh

Also filed as: OH SEUNG-HWA

2 granted patents·1 pending application·12 citations·filing 2014–2016

49Inventor score

Technology areasH10P

Files withSAMSUNG ELECTRONICS CO LTD3

Top patents by PatentIndex Score

3 records

0190US9846359B1Diffraction-based overlay marks and methods of overlay measurementSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 19, 2017·12 cites·20 claims
0246US9281250B2Method of detecting an asymmetric portion of an overlay mark and method of measuring an overlay including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 8, 2016·0 cites·20 claims
0341US2015294455A1Methods of testing pattern reliability and semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites

Join the waitlist — get patent alerts

Get an alert when Seung Hwa Oh files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →