Inventor · disambiguated record
Sergey Osechinskiy
Also filed as: OSECHINSKIY SERGEY · OSECHINSKIY SERGEY I
11 granted patents·1 pending application·138 citations·filing 2004–2025
88Inventor score
Top patents by PatentIndex Score
12 records- 0196US11635449B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2022·Granted Apr 25, 2023·6 cites·20 claims
- 0295US11307220B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2021·Granted Apr 19, 2022·6 cites·22 claims
- 0395US11029330B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2019·Granted Jun 8, 2021·8 cites·20 claims
- 0495US7178386B1Parallel fluid processing systems and methodsNANOSTREAM INC·Filed 2004·Granted Feb 20, 2007·113 cites·44 claims
- 0593US11940461B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2023·Granted Mar 26, 2024·2 cites·20 claims
- 0682US12241911B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2024·Granted Mar 4, 2025·0 cites·20 claims
- 0779US10161960B1Filed-mapping and focal-spot tracking for s-SNOMBRUKER NANO INC·Filed 2018·Granted Dec 25, 2018·1 cites·18 claims
- 0876US9448252B2Chemical nano-identification of a sample using normalized near-field spectroscopyBRUKER NANO INC·Filed 2014·Granted Sep 20, 2016·2 cites·21 claims
- 0974US2025147066A1Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2025·Application pending·0 cites
- 1066US9933453B2Chemical nano-identification of a sample using normalized near-field spectroscopyBRUKER NANO INC·Filed 2017·Granted Apr 3, 2018·0 cites·11 claims
- 1162US9846178B2Chemical nano-identification of a sample using normalized near-field spectroscopyBRUKER NANO INC·Filed 2016·Granted Dec 19, 2017·0 cites·16 claims
- 1257US10067159B2Field-mapping and focal-spot tracking for S-SNOMBRUKER NANO INC·Filed 2015·Granted Sep 4, 2018·0 cites·27 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →