Inventor · disambiguated record
Chusuke Munakata
Also filed as: MUNAKATA CHUSUKE
13 granted patents·445 citations·filing 1981–1990
94Inventor score
Files withHITACHI LTD13
Top patents by PatentIndex Score
13 records- 0191US4767211AApparatus for and method of measuring boundary surfaceHITACHI LTD·Filed 1987·Granted Aug 30, 1988·80 cites·17 claims
- 0288US4733063AScanning laser microscope with aperture alignmentHITACHI LTD·Filed 1986·Granted Mar 22, 1988·68 cites·1 claims
- 0382US4876458AApparatus for measuring particles in liquidHITACHI LTD·Filed 1988·Granted Oct 24, 1989·48 cites·7 claims
- 0482US4731855APattern defect inspection apparatusHITACHI LTD·Filed 1985·Granted Mar 15, 1988·74 cites·13 claims
- 0580US4563642AApparatus for nondestructively measuring characteristics of a semiconductor wafer with a junctionHITACHI LTD·Filed 1982·Granted Jan 7, 1986·34 cites·6 claims
- 0679US5140272AMethod of semiconductor surface measurment and an apparatus for realizing the sameHITACHI LTD·Filed 1988·Granted Aug 18, 1992·34 cites·8 claims
- 0769US4581578AApparatus for measuring carrier lifetimes of a semiconductor waferHITACHI LTD·Filed 1984·Granted Apr 8, 1986·32 cites·2 claims
- 0865US4827143AMonitor for particles of various materialsHITACHI LTD·Filed 1987·Granted May 2, 1989·28 cites·6 claims
- 0957US4464627ADevice for measuring semiconductor characteristicsHITACHI LTD·Filed 1981·Granted Aug 7, 1984·16 cites·7 claims
- 1053US5252719AProcess for preparing protein-oriented membraneHITACHI LTD·Filed 1990·Granted Oct 12, 1993·16 cites·9 claims
- 1143US4453181AScanning-image forming apparatus using photo response signalHITACHI LTD·Filed 1981·Granted Jun 5, 1984·6 cites·18 claims
- 1235US4672578AMethod of information recording on a semiconductor waferHITACHI LTD·Filed 1984·Granted Jun 9, 1987·7 cites·20 claims
- 1328US4791288AScanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrentsHITACHI LTD·Filed 1987·Granted Dec 13, 1988·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →