Inventor · disambiguated record
Masahiro Shibutani
Also filed as: SHIBUTANI MASAHIRO
11 granted patents·2 pending applications·96 citations·filing 2000–2019
87Inventor score
Technology areasA61B
Top patents by PatentIndex Score
13 records- 0169US7261416B2Eye's optical characteristics measuring systemTOPCON CORP·Filed 2006·Granted Aug 28, 2007·7 cites·9 claims
- 0268US6217172B1Ophthalmologic measuring systemTOPCON CORP·Filed 2000·Granted Apr 17, 2001·54 cites·7 claims
- 0360US6623117B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Sep 23, 2003·23 cites·11 claims
- 0452US11213202B2Ophthalmologic apparatus and method for controlling the sameTOPCON CORP·Filed 2019·Granted Jan 4, 2022·0 cites·12 claims
- 0550US9275283B2Fundus image processing apparatus and fundus observation apparatusSHIBUTANI MASAHIRO·Filed 2011·Granted Mar 1, 2016·1 cites·8 claims
- 0650US6824269B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Nov 30, 2004·6 cites·3 claims
- 0749US9498116B2Ophthalmologic apparatusKK TOPCON·Filed 2014·Granted Nov 22, 2016·0 cites·15 claims
- 0847US10667684B2OCT apparatusTOPCON CORP·Filed 2017·Granted Jun 2, 2020·0 cites·20 claims
- 0946US6789899B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2001·Granted Sep 14, 2004·1 cites·3 claims
- 1046US6676258B2Eye characteristic measurement apparatus with speckle noise reductionTOPCON CORP·Filed 2001·Granted Jan 13, 2004·2 cites·4 claims
- 1143US7011411B2Eye's optical characteristic measuring systemTOPCON CORP·Filed 2003·Granted Mar 14, 2006·2 cites·4 claims
- 1241US2007052927A1Ophthalmic examination program, ophthalmic examination apparatus, and ophthalmic examination systemTOPCON CORP·Filed 2006·Application pending·0 cites
- 1333US2003156256A1Eye's optical characteristic measuring systemFiled 2003·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Masahiro Shibutani files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →