Inventor · disambiguated record
Elmar Mayer
Also filed as: MAYER ELMAR · MAYER ELMAR J · MAYER ELMAR JOSEF
36 granted patents·1 pending application·442 citations·filing 1996–2024
97Inventor score
Top patents by PatentIndex Score
37 records- 0189US8154427B2Multiturn rotary encoder and method of operating a multiturn rotary encoderMAYER ELMAR·Filed 2010·Granted Apr 10, 2012·9 cites·10 claims
- 0288US6392224B1Scanning unit for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1998·Granted May 21, 2002·57 cites·42 claims
- 0387US6472658B2Photoelectric position measuring system that optimizes modulation of a scanning device and the intensity of a reference mark signalHEIDENHAIN GMBH DR JOHANNES·Filed 2001·Granted Oct 29, 2002·31 cites·26 claims
- 0486US6198534B1Scanning unit for an optical position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1998·Granted Mar 6, 2001·55 cites·29 claims
- 0585US5815262AApparatus for parallelized two-photon fluorescence correlation spectroscopy (TPA-FCS), and the use thereof for screening active compoundsBASF AG·Filed 1996·Granted Sep 29, 1998·83 cites·22 claims
- 0680US6963409B2Optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2003·Granted Nov 8, 2005·22 cites·13 claims
- 0779US10260908B2Position measuring device and method for operating a position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2017·Granted Apr 16, 2019·3 cites·11 claims
- 0878US6794637B1Optical device for measuring positionJOHANNAS HEIDENHAIN GMBH DR·Filed 2000·Granted Sep 21, 2004·20 cites·7 claims
- 0977US6603114B1Scanning head comprising a semiconductor substrate with a blind hole containing a light sourceHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Aug 5, 2003·34 cites·28 claims
- 1074US6742275B2Scale and position measuring system for absolute position determinationHEIDENHAIN GMBH DR JOHANNES·Filed 2003·Granted Jun 1, 2004·15 cites·21 claims
- 1172US9140580B2Method and apparatus for angle measurementBIELSKI STEFFEN·Filed 2012·Granted Sep 22, 2015·4 cites·17 claims
- 1270US6097490AOptical position measuring instrument for generating a reference pulse signalHEIDENHAIN GMBH DR JOHANNES·Filed 1998·Granted Aug 1, 2000·28 cites·37 claims
- 1366US7787970B2Position-measuring device and method for position measuringHEIDENHAIN GMBH DR JOHANNES·Filed 2005·Granted Aug 31, 2010·4 cites·18 claims
- 1462US7835014B2Position measuring arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 2008·Granted Nov 16, 2010·3 cites·17 claims
- 1562US7084390B2Position-measuring device including measuring graduation and scanning unitHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Aug 1, 2006·8 cites·25 claims
- 1660US2025067794A1Circuit arrangement with a diagnostic function for asics and method for diagnosis of asicsHEIDENHAIN GMBH DR JOHANNES·Filed 2024·Application pending·0 cites
- 1759US7199354B2Detector array for optical encodersRENCO ENCODERS INC·Filed 2004·Granted Apr 3, 2007·8 cites·15 claims
- 1858US8825439B2Multiturn rotary encoderMAYER ELMAR·Filed 2009·Granted Sep 2, 2014·3 cites·10 claims
- 1958US8820623B2Position-measuring deviceMAYER ELMAR·Filed 2008·Granted Sep 2, 2014·3 cites·23 claims
- 2057US10197388B2Position-measuring device able to monitor deviations from a setpoint behavior and method for operating the position-measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2013·Granted Feb 5, 2019·1 cites·25 claims
- 2156US6519044B1Scanner unit for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Feb 11, 2003·15 cites·22 claims
- 2255US7847704B2Method and device for transmitting signals from a position measuring arrangement to an evaluation unitHEIDENHAIN GMBH DR JOHANNES·Filed 2008·Granted Dec 7, 2010·1 cites·18 claims
- 2353US9768990B2Device for manipulating interface signalsKREUZER STEPHAN·Filed 2011·Granted Sep 19, 2017·1 cites·16 claims
- 2453USRE40676EScanner unit for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2005·Granted Mar 24, 2009·1 cites·61 claims
- 2551US9846135B2Moisture sensor arrangementE+E ELEKTRONIK GES M B H·Filed 2013·Granted Dec 19, 2017·1 cites·9 claims
- 2650US8570621B2Position measuring deviceBRAASCH JAN·Filed 2009·Granted Oct 29, 2013·2 cites·26 claims
- 2748US11537294B2Position-measuring device and method for operating the sameHEIDENHAIN GMBH DR JOHANNES·Filed 2021·Granted Dec 27, 2022·0 cites·15 claims
- 2848US7235776B2Method and device for regulating a light source of a position-measuring unitHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Jun 26, 2007·3 cites·22 claims
- 2948US6965437B2Scanning unit for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2001·Granted Nov 15, 2005·3 cites·20 claims
- 3046US10260909B2Position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2016·Granted Apr 16, 2019·0 cites·15 claims
- 3146US6320178B1Optoelectronic component arrangementDIE DR JOHANNES HEIDENHAIN GMB·Filed 1999·Granted Nov 20, 2001·15 cites·14 claims
- 3245US7719075B2Scanning head for optical position-measuring systemsHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted May 18, 2010·2 cites·20 claims
- 3345US7230726B2Scanning unit for a position measuring instrument for optical scanning of a object measuring graduationHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Jun 12, 2007·2 cites·35 claims
- 3445US7214928B2Scanning unit for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2001·Granted May 8, 2007·3 cites·39 claims
- 3545US7164482B2Position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted Jan 16, 2007·2 cites·58 claims
- 3644US10120359B2Device and method for the automated detection of an interfaceMAYER ELMAR·Filed 2009·Granted Nov 6, 2018·0 cites·18 claims
- 3732US8476580B2Angle-measuring device and line of products with such angle-measuring devicesMAYER ELMAR·Filed 2009·Granted Jul 2, 2013·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →