Inventor · disambiguated record
Cornel Bozdog
Also filed as: BOZDOG CORNEL
15 granted patents·4 pending applications·25 citations·filing 2013–2024
89Inventor score
Files withNOVA MEASURING INSTR LTD9NOVA MEASURING INSTR INC4NOVA LTD3MICRON TECHNOLOGY INC2GLOBALFOUNDRIES INC1
Top patents by PatentIndex Score
19 records- 0191US10533961B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2016·Granted Jan 14, 2020·5 cites·18 claims
- 0288US2025052704A1Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2024·Application pending·0 cites
- 0386US10876959B2Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2018·Granted Dec 29, 2020·2 cites·3 claims
- 0485US12066391B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2023·Granted Aug 20, 2024·0 cites·20 claims
- 0584US11885737B2Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2020·Granted Jan 30, 2024·1 cites·8 claims
- 0684US2024337590A1Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2024·Application pending·0 cites
- 0781US10030971B2Measurement system and method for measuring in thin filmsGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 24, 2018·5 cites·13 claims
- 0880US10209206B2Method and system for determining strain distribution in a sampleNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 19, 2019·6 cites·14 claims
- 0977US11906451B2Method and system for non-destructive metrology of thin layersNOVA LTD·Filed 2021·Granted Feb 20, 2024·0 cites·20 claims
- 1076US9528946B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2013·Granted Dec 27, 2016·2 cites·26 claims
- 1172US11668663B2Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR INC·Filed 2020·Granted Jun 6, 2023·0 cites·10 claims
- 1270US10197506B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2018·Granted Feb 5, 2019·1 cites·20 claims
- 1368US9915624B2Optical metrology for in-situ measurementsNOVA MEASURING INSTR LTD·Filed 2016·Granted Mar 13, 2018·1 cites·24 claims
- 1466US10302414B2Scatterometry method and systemNOVA MEASURING INSTR LTD·Filed 2015·Granted May 28, 2019·2 cites·8 claims
- 1563US2015316468A1Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2014·Application pending·0 cites
- 1661US2018172609A1Method and system for non-destructive metrology of thin layersNOVA MEASURING INSTR LTD·Filed 2017·Application pending·0 cites
- 1755US10943907B2Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitryMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 9, 2021·0 cites·15 claims
- 1852US10707211B2Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitryMICRON TECHNOLOGY INC·Filed 2018·Granted Jul 7, 2020·0 cites·26 claims
- 1935US10534275B2Method for use in process control of manufacture of patterned sampleNOVA MEASURING INSTR LTD·Filed 2016·Granted Jan 14, 2020·0 cites·13 claims
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