Inventor · disambiguated record
Alberto Calderon
Also filed as: CALDERON ALBERTO · CALDERON ALBERTO J
12 granted patents·1 pending application·48 citations·filing 2002–2025
89Inventor score
Top patents by PatentIndex Score
13 records- 0194US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 0279US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 0378US6815966B1System for burn-in testing of electronic devicesAEHR TEST SYSTEMS·Filed 2002·Granted Nov 9, 2004·24 cites·26 claims
- 0475US10976362B2Electronics tester with power saving stateAEHR TEST SYSTEMS·Filed 2020·Granted Apr 13, 2021·0 cites·11 claims
- 0572US10718808B2Electronics tester with current amplificationAEHR TEST SYSTEMS·Filed 2018·Granted Jul 21, 2020·0 cites·9 claims
- 0669US10151793B2Electronics tester with double-spiral thermal control passage in a thermal chuckAEHR TEST SYSTEMS·Filed 2017·Granted Dec 11, 2018·0 cites·76 claims
- 0767US9857418B2Electronics tester with group and individual current configurationsAEHR TEST SYSTEMS·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 0867US2025251438A1Tester apparatus, testing method and leakage detection circuitAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 0965US9500702B2Electronics tester with hot fluid thermal controlAEHR TEST SYSTEMS·Filed 2016·Granted Nov 22, 2016·0 cites·13 claims
- 1061US7063544B2System for burn-in testing of electronic devicesAEHR TEST SYSTEMS·Filed 2004·Granted Jun 20, 2006·7 cites·18 claims
- 1155US9086449B2Adhesively attached stand-offs on a portable pack for an electronics testerSTEPS STEVEN C·Filed 2012·Granted Jul 21, 2015·0 cites·87 claims
- 1255US7902846B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2010·Granted Mar 8, 2011·0 cites·93 claims
- 1353US8198909B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionSTEPS STEVEN C·Filed 2011·Granted Jun 12, 2012·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →