Inventor · disambiguated record
Eisaku Yamashita
Also filed as: YAMASHITA EISAKU
5 granted patents·1 pending application·58 citations·filing 1992–2008
78Inventor score
Top patents by PatentIndex Score
6 records- 0161US5164665AIC testerMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Nov 17, 1992·24 cites·2 claims
- 0251US5430737AApparatus for testing function of integrated circuitMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Jul 4, 1995·21 cites·6 claims
- 0349US7498180B2Method for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2006·Granted Mar 3, 2009·1 cites·11 claims
- 0444US7662647B2Method for manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2008·Granted Feb 16, 2010·0 cites·4 claims
- 0536US6223318B1IC tester having region in which various test conditions are storedMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Apr 24, 2001·12 cites·12 claims
- 0632US2003220758A1Method for testing an AD-converterMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →