Inventor · disambiguated record
Masashi Matsumura
Also filed as: MATSUMURA MASASHI
9 granted patents·1 pending application·136 citations·filing 1994–2013
88Inventor score
Files withRENESAS TECH CORP3MITSUBISHI ELECTRIC CORP2RENESAS ELECTRONICS CORP2AKIYAMA MIHOKO1MATSUMURA MASASHI1
Top patents by PatentIndex Score
10 records- 0186US5991232AClock synchronous memory embedded semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 23, 1999·68 cites·18 claims
- 0278US8599639B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2013·Granted Dec 3, 2013·4 cites·5 claims
- 0375US8004923B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 23, 2011·3 cites·2 claims
- 0475US5930194ASemiconductor memory device capable of block writing in large bus widthMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 27, 1999·37 cites·12 claims
- 0572US7408818B2Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2007·Granted Aug 5, 2008·7 cites·10 claims
- 0662US7656736B2Semiconductor device including internal voltage generation circuitRENESAS TECH CORP·Filed 2007·Granted Feb 2, 2010·3 cites·3 claims
- 0757US5519677ABiaxial actuator for driving an objective lens in both focusing and tracking directionsSONY CORP·Filed 1994·Granted May 21, 1996·12 cites·14 claims
- 0855US8451678B2Semiconductor device including internal voltage generation circuitAKIYAMA MIHOKO·Filed 2011·Granted May 28, 2013·1 cites·2 claims
- 0949US8837238B2Semiconductor device having a plurality of memory modulesMATSUMURA MASASHI·Filed 2012·Granted Sep 16, 2014·1 cites·8 claims
- 1040US2008298156A1Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2008·Application pending·0 cites
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