Inventor · disambiguated record
Yukio Matsuyama
Also filed as: MATSUYAMA YUKIO
17 granted patents·811 citations·filing 1984–2004
96Inventor score
Top patents by PatentIndex Score
17 records- 0199US5986263AElectron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 1997·Granted Nov 16, 1999·164 cites·21 claims
- 0292US6587581B1Visual inspection method and apparatus thereforHITACHI LTD·Filed 1998·Granted Jul 1, 2003·118 cites·59 claims
- 0392US6172365B1Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 1999·Granted Jan 9, 2001·48 cites·10 claims
- 0491US6373054B2Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 2001·Granted Apr 16, 2002·23 cites·22 claims
- 0589US4628531APattern checking apparatusHITACHI LTD·Filed 1984·Granted Dec 9, 1986·100 cites·9 claims
- 0688US5293538AMethod and apparatus for the inspection of defectsHITACHI LTD·Filed 1991·Granted Mar 8, 1994·80 cites·6 claims
- 0787US6717142B2Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 2002·Granted Apr 6, 2004·16 cites·15 claims
- 0885US5780866AMethod and apparatus for automatic focusing and a method and apparatus for three dimensional profile detectionHITACHI LTD·Filed 1995·Granted Jul 14, 1998·62 cites·26 claims
- 0983US6828554B2Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 2004·Granted Dec 7, 2004·11 cites·8 claims
- 1075US6333992B1Defect judgement processing method and apparatusHITACHI LTD·Filed 1997·Granted Dec 25, 2001·47 cites·28 claims
- 1169US7122796B2Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the sameHITACHI LTD·Filed 2004·Granted Oct 17, 2006·4 cites·11 claims
- 1267US5054944ASerial printer having a carrier cable connected to a movable print headNEC CORP·Filed 1990·Granted Oct 8, 1991·23 cites·5 claims
- 1366US4860371AMethod and apparatus for detecting pattern defectsHITACHI LTD·Filed 1987·Granted Aug 22, 1989·40 cites·11 claims
- 1460US5763123AMethod for producing thin-film substrateHITACHI LTD·Filed 1997·Granted Jun 9, 1998·27 cites·6 claims
- 1558US4959030AElectrical connector for connecting two flat cables to a circuit boardJAPAN AVIATION ELECTRON·Filed 1990·Granted Sep 25, 1990·23 cites·13 claims
- 1656US6249598B1Solder testing apparatusHITACHI LTD·Filed 1997·Granted Jun 19, 2001·21 cites·21 claims
- 1733US5376023AElectric connectorNEC CORP·Filed 1992·Granted Dec 27, 1994·4 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when Yukio Matsuyama files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →