Inventor · disambiguated record
Yoshiyuki Enomoto
Also filed as: ENOMOTO YOSHIYUKI
20 granted patents·3 pending applications·193 citations·filing 1995–2021
93Inventor score
Top patents by PatentIndex Score
23 records- 0193US11413955B2Working machineKUBOTA KK·Filed 2020·Granted Aug 16, 2022·3 cites·10 claims
- 0287US7842986B2Solid-state imaging device and method for fabricating the same related application dataSONY CORP·Filed 2008·Granted Nov 30, 2010·10 cites·6 claims
- 0385US8373786B2Solid-state imaging device, manufacturing method thereof, and electronic deviceSONY CORP·Filed 2009·Granted Feb 12, 2013·7 cites·22 claims
- 0482US7442973B2Solid-state imaging device and production method thereforSONY CORP·Filed 2003·Granted Oct 28, 2008·30 cites·3 claims
- 0581US7041956B2Solid-state image pickup device with non-hydrogen-absorbing waveguideSONY CORP·Filed 2004·Granted May 9, 2006·27 cites·2 claims
- 0679US5963827AMethod for producing via contacts in a semiconductor deviceSONY CORP·Filed 1995·Granted Oct 5, 1999·57 cites·2 claims
- 0771US7046353B2Surface inspection systemTOPCON CORP·Filed 2002·Granted May 16, 2006·14 cites·11 claims
- 0870US5638220ADevice for producing ring-shaped laser spotTOPCON CORP·Filed 1995·Granted Jun 10, 1997·38 cites·3 claims
- 0966US2013207215A1Solid-state imaging device, manufacturing method thereof, and electronic deviceSONY CORP·Filed 2013·Application pending·0 cites
- 1065US12319362B2Housing body and working machineKUBOTA KK·Filed 2021·Granted Jun 3, 2025·0 cites·11 claims
- 1160US7378340B2Method of manufacturing semiconductor device and semiconductor deviceSONY CORP·Filed 2006·Granted May 27, 2008·2 cites·6 claims
- 1256US12481221B2Projection exposure device and projection exposure methodV TECH CO LTD·Filed 2021·Granted Nov 25, 2025·0 cites·5 claims
- 1356US8243264B2Measuring apparatusISOZAKI HISASHI·Filed 2010·Granted Aug 14, 2012·1 cites·6 claims
- 1451US7642655B2Semiconductor device and method of manufacture thereofSONY CORP·Filed 2005·Granted Jan 5, 2010·0 cites·1 claims
- 1551US6856018B2Semiconductor device and method of manufacture thereofSONY CORP·Filed 2001·Granted Feb 15, 2005·2 cites·1 claims
- 1648US7154181B2Semiconductor device and method of manufacturing the sameSONY CORP·Filed 2004·Granted Dec 26, 2006·2 cites·6 claims
- 1743US6989330B2Semiconductor device and method of manufacture thereofSONY CORP·Filed 2004·Granted Jan 24, 2006·0 cites·2 claims
- 1841US7245388B2Method and device for surface inspectionTOPCON CORP·Filed 2003·Granted Jul 17, 2007·0 cites·16 claims
- 1939US2011043808A1Measuring apparatusISOZAKI HISASHI·Filed 2010·Application pending·0 cites
- 2038US10163776B2Designing method of capacitive element in multilayer wirings for integrated circuit devices based on statistical processIZUHA KYOKO·Filed 2010·Granted Dec 25, 2018·0 cites·17 claims
- 2138US2011292362A1Exposure apparatusENOMOTO YOSHIYUKI·Filed 2011·Application pending·0 cites
- 2237US7038317B2Semiconductor device and method of manufacturing sameSONY CORP·Filed 2003·Granted May 2, 2006·0 cites·12 claims
- 2337US6780793B2Production method of semiconductor deviceSONY CORP·Filed 2001·Granted Aug 24, 2004·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →