Inventor · disambiguated record
Yoshihito Kobayashi
Also filed as: KOBAYASHI YOSHIHITO
39 granted patents·7 pending applications·1,059 citations·filing 1985–2024
98Inventor score
Files withADVANTEST CORP23TOSHIBA KK10KOBAYASHI YOSHIHITO7TAKEDA RIKEN IND CO LTD2TOSHIBA MEMORY CORP2
Top patents by PatentIndex Score
46 records- 0193US6066822ASemiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted May 23, 2000·94 cites·7 claims
- 0292US7800393B2Electronic device test apparatus for successively testing electronic devicesADVANTEST CORP·Filed 2009·Granted Sep 21, 2010·15 cites·16 claims
- 0392US7612575B2Electronic device test apparatus for successively testing electronic devicesADVANTEST CORP·Filed 2005·Granted Nov 3, 2009·17 cites·13 claims
- 0491US5403695AResist for forming patterns comprising an acid generating compound and a polymer having acid decomposable groupsTOSHIBA KK·Filed 1992·Granted Apr 4, 1995·83 cites·16 claims
- 0590US6445203B1Electric device testing apparatusADVANTEST CORP·Filed 1999·Granted Sep 3, 2002·103 cites·22 claims
- 0690US6384593B1Semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted May 7, 2002·40 cites·10 claims
- 0788US5326675APattern forming method including the formation of an acidic coating layer on the radiation-sensitive layerTOSHIBA KK·Filed 1992·Granted Jul 5, 1994·49 cites·18 claims
- 0887US6104183ASemiconductor device testing apparatusADVANTEST CORP·Filed 1996·Granted Aug 15, 2000·62 cites·21 claims
- 0983US9348218B2Mask cleaner and cleaning methodTOSHIBA KK·Filed 2013·Granted May 24, 2016·3 cites·15 claims
- 1083US6437593B1Electric device testing apparatus and electric device testing methodADVANTEST CORP·Filed 2000·Granted Aug 20, 2002·29 cites·3 claims
- 1182US6433294B1Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 2000·Granted Aug 13, 2002·21 cites·7 claims
- 1281US6075216ADevice transfer and reinspection method for IC handlerADVANTEST CORP·Filed 1997·Granted Jun 13, 2000·64 cites·6 claims
- 1379US6856128B2Semiconductor device testing apparatus and a test tray for use in the testing apparatusADVANTEST CORP·Filed 2001·Granted Feb 15, 2005·19 cites·87 claims
- 1479US5100768APhotosensitive compositionTOSHIBA KK·Filed 1990·Granted Mar 31, 1992·34 cites·12 claims
- 1577US5635832AIC carrier for use with an IC handlerADVANTEST CORP·Filed 1995·Granted Jun 3, 1997·41 cites·5 claims
- 1676US9599909B2Electrostatic chuck cleaner, cleaning method, and exposure apparatusTOSHIBA KK·Filed 2014·Granted Mar 21, 2017·2 cites·17 claims
- 1773US8551393B2Patterning method and method for manufacturing semiconductor deviceKOBAYASHI YOSHIHITO·Filed 2010·Granted Oct 8, 2013·3 cites·14 claims
- 1873US6406246B1Device handlerADVANTEST CORP·Filed 1999·Granted Jun 18, 2002·43 cites·11 claims
- 1973US5625287ATest tray positioning stopper mechanism for automatic handlerADVANTEST CORP·Filed 1995·Granted Apr 29, 1997·23 cites·4 claims
- 2072US5772387ADevice transfer apparatus and device reinspection method for IC handlerADVANTEST CORP·Filed 1995·Granted Jun 30, 1998·43 cites·8 claims
- 2172US4760924AIC test equipment having input magazine replenisherTAKEDA RIKEN IND CO LTD·Filed 1987·Granted Aug 2, 1988·23 cites·9 claims
- 2271US5580702AMethod for forming resist patternsTOSHIBA KK·Filed 1994·Granted Dec 3, 1996·31 cites·18 claims
- 2369US9808841B2Reticle chuck cleaner and reticle chuck cleaning methodKOBAYASHI YOSHIHITO·Filed 2012·Granted Nov 7, 2017·1 cites·12 claims
- 2467US10160014B2Chuck cleaner and cleaning methodTOSHIBA MEMORY CORP·Filed 2014·Granted Dec 25, 2018·1 cites·9 claims
- 2566USRE35821EPattern forming method including the formation of an acidic coating layer on the radiation-sensitive layerTOSHIBA KK·Filed 1996·Granted Jun 9, 1998·23 cites·1 claims
- 2664US6320398B1Semiconductor device testing apparatusADVANTEST CORP·Filed 1997·Granted Nov 20, 2001·30 cites·32 claims
- 2764US5279921APattern formation resist and pattern formation methodTOSHIBA KK·Filed 1991·Granted Jan 18, 1994·25 cites·10 claims
- 2863US5091810AFloating type magnetic head having head core affixed to outside surface of sliderTDK CORP·Filed 1990·Granted Feb 25, 1992·15 cites·12 claims
- 2963US2025069909A1Substrate processing apparatus, substrate processing method, and semiconductor device manufacturing methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 3062US4715501AIC test equipmentTAKEDA RIKEN IND CO LTD·Filed 1985·Granted Dec 29, 1987·16 cites·8 claims
- 3161US6728652B1Method of testing electronic components and testing apparatus for electronic componentsADVANTEST CORP·Filed 1999·Granted Apr 27, 2004·26 cites·2 claims
- 3260US6384360B1IC pickup, IC carrier and IC testing apparatus using the sameADVANTEST CORP·Filed 1999·Granted May 7, 2002·24 cites·15 claims
- 3355US11084069B2Chuck cleaner and cleaning methodTOSHIBA MEMORY CORP·Filed 2018·Granted Aug 10, 2021·0 cites·8 claims
- 3453US5814432AMethod of forming patterns for use in manufacturing electronic devicesTOSHIBA KK·Filed 1995·Granted Sep 29, 1998·18 cites·29 claims
- 3553US5261775AIC test equipmentADVANTEST CORP·Filed 1991·Granted Nov 16, 1993·15 cites·5 claims
- 3650US6459259B1Tester for semiconductor devices and test tray used for the sameADVANTEST CORP·Filed 1998·Granted Oct 1, 2002·13 cites·86 claims
- 3744US8663895B2Method for manufacturing template and method for manufacturing semiconductor deviceKOBAYASHI YOSHIHITO·Filed 2010·Granted Mar 4, 2014·0 cites·7 claims
- 3844US2013224324A1Sealant-attached template, method for storing template, template sealing apparatus, and template unsealing apparatusKOBAYASHI YOSHIHITO·Filed 2012·Application pending·0 cites
- 3943US2012244243A1Imprint lithography template, method of fabricating an imprint lithography template, and method of forming a patternKOBAYASHI YOSHIHITO·Filed 2012·Application pending·0 cites
- 4040US5973493ATest tray positioning stopper mechanism for automatic handlerADVANTEST CORP·Filed 1996·Granted Oct 26, 1999·6 cites·3 claims
- 4138US2002036161A1Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatusADVANTEST CORP·Filed 2001·Application pending·0 cites
- 4238US2012112370A1Template, method of forming template, and method of manufacturing semiconductor deviceKOBAYASHI YOSHIHITO·Filed 2011·Application pending·0 cites
- 4336US5091282AAlkali soluble phenol polymer photosensitive compositionTOSHIBA KK·Filed 1990·Granted Feb 25, 1992·4 cites·18 claims
- 4436US2010330807A1Semiconductor apparatus manufacturing method and imprint templateKOBAYASHI YOSHIHITO·Filed 2010·Application pending·0 cites
- 4533US2010147088A1Electronic device test apparatus and method of testing electronic devicesADVANTEST CORP·Filed 2006·Application pending·0 cites
- 4631USD431580SIC tray holderADVANTEST CORP·Filed 1999·Granted Oct 3, 2000·0 cites·1 claims
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