Inventor · disambiguated record
Joseph J. Van Horn
Also filed as: VAN HORN JOSEPH J · VAN HORN JOSEPH JOHN
4 granted patents·1 pending application·171 citations·filing 1992–2002
79Inventor score
Files withIBM5
Top patents by PatentIndex Score
5 records- 0193US6275051B1Segmented architecture for wafer test and burn-inIBM·Filed 1999·Granted Aug 14, 2001·127 cites·27 claims
- 0263US5519193AMethod and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiationIBM·Filed 1992·Granted May 21, 1996·26 cites·33 claims
- 0361US6747472B2Temporary device attach structure for test and burn in of microjoint interconnects and method for fabricating the sameIBM·Filed 2002·Granted Jun 8, 2004·8 cites·22 claims
- 0442US6255208B1Selective wafer-level testing and burn-inIBM·Filed 1999·Granted Jul 3, 2001·10 cites·18 claims
- 0533US2001050567A1Segmented architecture for wafer test & burn-inIBM·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →