Inventor · disambiguated record
Young Bae Chung
Also filed as: CHUNG YOUNG B · CHUNG YOUNG BAE
8 granted patents·2 pending applications·16 citations·filing 1988–2023
79Inventor score
Top patents by PatentIndex Score
10 records- 0178US11442079B2Contact device for electrical testISC CO LTD·Filed 2020·Granted Sep 13, 2022·1 cites·18 claims
- 0275US7438563B2Connector for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 21, 2008·9 cites·32 claims
- 0360US11073536B2ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assemblyISC CO LTD·Filed 2019·Granted Jul 27, 2021·1 cites·20 claims
- 0454US12504468B2Test connectorISC CO LTD·Filed 2023·Granted Dec 23, 2025·0 cites·15 claims
- 0544US11385259B2Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe memberISC CO LTD·Filed 2018·Granted Jul 12, 2022·0 cites·11 claims
- 0643US11555829B2Probe member for pogo pin, manufacturing method therefor and pogo pin comprising sameISC CO LTD·Filed 2018·Granted Jan 17, 2023·0 cites·13 claims
- 0740US2008180124A1Cooling apparatus for semiconductor deviceISC TECHNOLOGY CO LTD·Filed 2008·Application pending·0 cites
- 0833US4933787ATape loading device for high-speed search of a VCRGOLD STAR CO·Filed 1988·Granted Jun 12, 1990·3 cites·1 claims
- 0931US2016018440A1Contact Device for Test and Test SocketISC CO LTD·Filed 2015·Application pending·0 cites
- 1024US5380263AWaist sporting equipmentFiled 1994·Granted Jan 10, 1995·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →