Inventor · disambiguated record
Martinus Gerardus Johannes Maria Maassen
Also filed as: MAASSEN MARTINUS · MAASSEN MARTINUS GERARDUS JOHANNES MARIA · MAASSEN MARTINUS GERARDUS MARIA JOHANNES
9 granted patents·1 pending application·6 citations·filing 2016–2023
79Inventor score
Top patents by PatentIndex Score
10 records- 0183US12463010B2Multiple charged-particle beam apparatus and methodsASML NETHERLANDS BV·Filed 2023·Granted Nov 4, 2025·0 cites·21 claims
- 0281US10884342B2Method and apparatus for predicting performance of a metrology systemASML NETHERLANDS BV·Filed 2016·Granted Jan 5, 2021·2 cites·20 claims
- 0376US10416567B2Illumination system and metrology systemASML NETHERLANDS BV·Filed 2017·Granted Sep 17, 2019·2 cites·13 claims
- 0474US10403471B2Systems and methods for charged particle beam modulationHERMES MICROVISION INC·Filed 2017·Granted Sep 3, 2019·2 cites·21 claims
- 0571US12165837B2System and method for scanning a sample using multi-beam inspection apparatusASML NETHERLANDS BV·Filed 2022·Granted Dec 10, 2024·0 cites·13 claims
- 0667US11854765B2Multiple charged-particle beam apparatus and methodsASML NETHERLANDS BV·Filed 2020·Granted Dec 26, 2023·0 cites·17 claims
- 0761US12183543B2Multi-modal operations for multi-beam inspection systemASML NETHERLANDS BV·Filed 2020·Granted Dec 31, 2024·0 cites·15 claims
- 0858US11049689B2Systems and methods for charged particle beam modulationASML NETHERLANDS BV·Filed 2019·Granted Jun 29, 2021·0 cites·7 claims
- 0955US11798777B2Charged particle beam apparatus, and systems and methods for operating the apparatusASML NETHERLANDS BV·Filed 2020·Granted Oct 24, 2023·0 cites·20 claims
- 1048US2023086984A1Beam array geometry optimizer for multi-beam inspection systemASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →