Inventor · disambiguated record
Woo-Hyun Seo
Also filed as: SEO WOO-HYUN
7 granted patents·4 pending applications·19 citations·filing 2006–2010
79Inventor score
Files withHYNIX SEMICONDUCTOR INC5SEO WOO-HYUN3IND ACADEMIC COOP1SAMSUNG ELECTRONICS CO LTD1SILTRON INC1
Top patents by PatentIndex Score
11 records- 0162US8122306B2Test circuit for supporting concurrent test mode in a semiconductor memorySEO WOO-HYUN·Filed 2008·Granted Feb 21, 2012·5 cites·5 claims
- 0262US7689883B2Test control circuit and semiconductor memory device including the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 30, 2010·4 cites·20 claims
- 0361US7728644B2Skew compensation circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jun 1, 2010·4 cites·24 claims
- 0460US7920417B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Apr 5, 2011·4 cites·15 claims
- 0550US8036026B2Semiconductor memory device and method for operating the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Oct 11, 2011·2 cites·10 claims
- 0644US7767596B2Wafer support pin for preventing slip dislocation during annealing of water and wafer annealing method using the sameSILTRON INC·Filed 2007·Granted Aug 3, 2010·0 cites·10 claims
- 0744US2008009302A1Apparatus and method for channel feedback in a wireless communication systemSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0844US2007121746A1Apparatus and method for dynamic channel allocation with low complexity in a multi-carrier communication systemIND ACADEMIC COOP·Filed 2006·Application pending·0 cites
- 0936US8067969B2Integrated circuitSEO WOO-HYUN·Filed 2009·Granted Nov 29, 2011·0 cites·26 claims
- 1031US2011205819A1Redundancy data storage circuit, redundancy data control method and repair determination circuit of semiconductor memoryHYNIX SEMICONDUCTOR INC·Filed 2010·Application pending·0 cites
- 1130US2010125431A1Compact test circuit and integrated circuit having the sameSEO WOO-HYUN·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →