Inventor · disambiguated record
Ki-Jae Song
Also filed as: SONG KI-JAE
18 granted patents·6 pending applications·43 citations·filing 2007–2023
91Inventor score
Top patents by PatentIndex Score
24 records- 0186US10732219B2Apparatus and method for testing semiconductor device and system comprising the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 4, 2020·3 cites·20 claims
- 0284US8023349B2Memory system, memory test system and method of testing memory system and memory test systemSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Sep 20, 2011·9 cites·20 claims
- 0382US10855185B2Semiconductor circuit including a DC-DC converter and a voltage regulatorSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 1, 2020·4 cites·19 claims
- 0474US9513333B2Test interface board and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Dec 6, 2016·3 cites·20 claims
- 0572US9759769B2Rechargeable power module and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Sep 12, 2017·2 cites·7 claims
- 0671US8872531B2Semiconductor device and test apparatus including the sameSONG KI-JAE·Filed 2011·Granted Oct 28, 2014·6 cites·17 claims
- 0770US7671617B2Test system to test multi-chip package compensating a signal distortionSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Mar 2, 2010·7 cites·17 claims
- 0869US12287367B2Test board and test device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Apr 29, 2025·0 cites·20 claims
- 0969US8106675B2Test systemSONG KI-JAE·Filed 2009·Granted Jan 31, 2012·4 cites·17 claims
- 1068US7755449B2Printed circuit board having impedance-matched strip transmission lineSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jul 13, 2010·3 cites·20 claims
- 1167US10551434B2Rechargeable power module and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 4, 2020·1 cites·7 claims
- 1252US8407659B2Method of designing a printed circuit boardJEONG JAE-HOON·Filed 2010·Granted Mar 26, 2013·1 cites·11 claims
- 1351US8832638B2Package test devices having a printed circuit boardSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Sep 9, 2014·0 cites·8 claims
- 1449US9612276B2Test device and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 4, 2017·0 cites·19 claims
- 1548US10203369B2Test board, test equipment, test system, and test methodSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 12, 2019·0 cites·11 claims
- 1646US10816594B2Apparatus for testing a signal speed of a semiconductor package and method of manufacturing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Oct 27, 2020·0 cites·17 claims
- 1744US2008150097A1Semiconductor device with reduced power noiseSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1841US8482308B2Connecting unit to test semiconductor chips and apparatus to test semiconductor chips having the sameSONG KI-JAE·Filed 2009·Granted Jul 9, 2013·0 cites·13 claims
- 1938US8750061B2Memory system, memory test system and method of testing memory system and memory test systemCHO SOO-HAENG·Filed 2011·Granted Jun 10, 2014·0 cites·14 claims
- 2038US2012150478A1Method of testing an object and apparatus for performing the sameSONG KI-JAE·Filed 2011·Application pending·0 cites
- 2136US2017023633A1Test board and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
- 2236US2013342236A1Test interface boards and test systemsSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 2335US2008109689A1Test system improving signal integrity by restraining wave reflectionSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 2434US2012152603A1Printed circuit board including at least one layerSONG KI JAE·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →