Inventor · disambiguated record
Tomohiko Kanemitsu
Also filed as: KANEMITSU TOMOHIKO
6 granted patents·8 pending applications·56 citations·filing 1998–2022
77Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD7PANASONIC CORP2PANASONIC IP MAN CO LTD2KATSUMA NOBUHIRO1NUVOTON TECHNOLOGY CORP JAPAN1
Top patents by PatentIndex Score
14 records- 0161US6393564B1Decrypting deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted May 21, 2002·48 cites·20 claims
- 0260US11904869B2Monitoring system and non-transitory storage mediumNUVOTON TECHNOLOGY CORP JAPAN·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 0351US7733112B2Semiconductor testing circuit and semiconductor testing methodPANASONIC CORP·Filed 2008·Granted Jun 8, 2010·2 cites·8 claims
- 0441US7148676B2Ancillary equipment for testing semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Dec 12, 2006·5 cites·13 claims
- 0538US7251761B2Assembly for LSI test and method for the testMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Jul 31, 2007·1 cites·13 claims
- 0638US2018259647A1Imaging device and solid-state imaging element used in samePANASONIC IP MAN CO LTD·Filed 2018·Application pending·0 cites
- 0737US2009243640A1Conductive contact pin and semiconductor testing equipmentPANASONIC CORP·Filed 2009·Application pending·0 cites
- 0833US2008007285A1Handler and method of testing semiconductor device by means of the handlerMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 0933US2008094096A1Semiconductor testing equipment and semiconductor testing methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 1030US10281565B2Distance measuring device and solid-state image sensor used thereinPANASONIC IP MAN CO LTD·Filed 2016·Granted May 7, 2019·0 cites·11 claims
- 1130US2005258856A1High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 1230US2011298487A1Semiconductor testing apparatus and testing methodKATSUMA NOBUHIRO·Filed 2011·Application pending·0 cites
- 1326US2004133834A1Lsi inspection method and apparatus, and ls1 testerFiled 2002·Application pending·0 cites
- 1424US2006200714A1Test equipment for semiconductorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →