Inventor · disambiguated record
Masahiko Ajima
Also filed as: AJIMA MASAHIKO
17 granted patents·2 pending applications·124 citations·filing 2009–2019
92Inventor score
Top patents by PatentIndex Score
19 records- 0173USD625749SElectron microscopeHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 19, 2010·18 cites·1 claims
- 0273USD623211SElectron microscopeHITACHI HIGH TECH CORP·Filed 2009·Granted Sep 7, 2010·18 cites·1 claims
- 0372USD633538SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 1, 2011·18 cites·1 claims
- 0471USD633537SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 1, 2011·17 cites·1 claims
- 0570USD632323SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Feb 8, 2011·17 cites·1 claims
- 0670USD626579SElectron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Nov 2, 2010·17 cites·1 claims
- 0766US9633817B2Diaphragm mounting member and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 25, 2017·1 cites·16 claims
- 0854US11221280B2Method of preparing biological tissue sample and method of observing biological tissue section sampleHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 11, 2022·0 cites·13 claims
- 0949US9373480B2Charged particle beam device and filter memberHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 21, 2016·0 cites·11 claims
- 1049US9251996B2Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jigHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 2, 2016·0 cites·18 claims
- 1149US9240305B2Charged particle beam device and sample observation methodHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 19, 2016·0 cites·17 claims
- 1249USD730962SBase of a thin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 2, 2015·6 cites·1 claims
- 1345US9263232B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 16, 2016·0 cites·15 claims
- 1444USD635168SPortion of an electron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·5 cites·1 claims
- 1544USD635167SPortion of an electron microscopeHITACHI HIGH TECH CORP·Filed 2010·Granted Mar 29, 2011·5 cites·1 claims
- 1644US2015213999A1Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1742US2024077712A1Microscope Slide and Method for Selecting the SameHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 1839US8809782B2Scanning electron microscopeOHTAKI TOMOHISA·Filed 2010·Granted Aug 19, 2014·0 cites·14 claims
- 1931USD731570SThin membrane holder for an electron microscopeHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 9, 2015·2 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →