Inventor · disambiguated record
Lyle Shirley
Also filed as: SHIRLEY LYLE · SHIRLEY LYLE G
20 granted patents·2 pending applications·526 citations·filing 1996–2021
95Inventor score
Files withMASSACHUSETTS INST TECHNOLOGY10SHIRLEY LYLE G7DIMENSIONAL PHOTONICS INTERNAT2DIMENSIONAL PHOTONICS INC1SHIRLEY LYLE1
Top patents by PatentIndex Score
22 records- 0197US6690474B1Apparatus and methods for surface contour measurementMASSACHUSETTS INST TECHNOLOGY·Filed 2000·Granted Feb 10, 2004·135 cites·84 claims
- 0292US7242484B2Apparatus and methods for surface contour measurementMASSACHUSETTS INST TECHNOLOGY·Filed 2005·Granted Jul 10, 2007·22 cites·10 claims
- 0390US8265375B2Method and apparatus for remote sensing of objects utilizing radiation speckleSHIRLEY LYLE G·Filed 2007·Granted Sep 11, 2012·21 cites·16 claims
- 0490US6031612AApparatus and methods for contour measurement using movable sourcesMASSACHUSETTS INST TECHNOLOGY·Filed 1999·Granted Feb 29, 2000·84 cites·31 claims
- 0589US5870191AApparatus and methods for surface contour measurementMASSACHUSETTS INST TECHNOLOGY·Filed 1996·Granted Feb 9, 1999·88 cites·50 claims
- 0688US6937350B2Apparatus and methods for optically monitoring thicknessMASSACHUSETTS INST TECHNOLOGY·Filed 2002·Granted Aug 30, 2005·41 cites·22 claims
- 0785US6952270B2Apparatus and methods for surface contour measurementsMASSACHUSETTS INST TECHNOLOGY·Filed 2003·Granted Oct 4, 2005·24 cites·11 claims
- 0877US5811826AMethods and apparatus for remotely sensing the orientation of an objectMASSACHUSETTS INST TECHNOLOGY·Filed 1997·Granted Sep 22, 1998·41 cites·19 claims
- 0974US8736847B2Method and apparatus for imagingSHIRLEY LYLE G·Filed 2011·Granted May 27, 2014·4 cites·43 claims
- 1073US10935364B2Method and apparatus for remote sensing of objects utilizing radiation speckleSHIRLEY LYLE G·Filed 2019·Granted Mar 2, 2021·1 cites·20 claims
- 1171US6341015B2Compensation for measurement uncertainty due to atmospheric effectsMASSACHUSETTS INST TECHNOLOGY·Filed 2001·Granted Jan 22, 2002·14 cites·26 claims
- 1270US7184149B2Methods and apparatus for reducing error in interferometric imaging measurementsDIMENSIONAL PHOTONICS INTERNAT·Filed 2004·Granted Feb 27, 2007·12 cites·4 claims
- 1368US11781855B2Surface sensing probe and methods of useSHIRLEY LYLE G·Filed 2021·Granted Oct 10, 2023·0 cites·11 claims
- 1466US9582883B2Method and apparatus for remote sensing and comparing utilizing radiation speckleSHIRLEY LYLE G·Filed 2014·Granted Feb 28, 2017·0 cites·20 claims
- 1566US8810800B2Dimensional probe and methods of useSHIRLEY LYLE G·Filed 2009·Granted Aug 19, 2014·1 cites·24 claims
- 1666US5900936AMethod and apparatus for detecting relative displacement using a light sourceMASSACHUSETTS INST TECHNOLOGY·Filed 1997·Granted May 4, 1999·30 cites·18 claims
- 1759US10281257B2Method and apparatus for remote sensing of objects utilizing radiation speckleSHIRLEY LYLE G·Filed 2017·Granted May 7, 2019·0 cites·16 claims
- 1857US7349102B2Methods and apparatus for reducing error in interferometric imaging measurementsDIMENSIONAL PHOTONICS INTERNAT·Filed 2007·Granted Mar 25, 2008·2 cites·15 claims
- 1945US8761494B2Method and apparatus for remote sensing of objects utilizing radiation speckle and projected referenceSHIRLEY LYLE·Filed 2012·Granted Jun 24, 2014·0 cites·22 claims
- 2038US6229619B1Compensation for measurement uncertainty due to atmospheric effectsMASSACHUSETTS INST TECHNOLOGY·Filed 1999·Granted May 8, 2001·6 cites·34 claims
- 2136US2003038933A1Calibration apparatus, system and methodDIMENSIONAL PHOTONICS INC·Filed 2002·Application pending·0 cites
- 2236US2003072011A1Method and apparatus for combining views in three-dimensional surface profilingFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →