Inventor · disambiguated record
Eric Yeh-Wei Tseo
Also filed as: TSEO ERIC · TSEO ERIC YEH-WEI
8 granted patents·1 pending application·1,272 citations·filing 1996–2017
88Inventor score
Top patents by PatentIndex Score
9 records- 0196US6369952B1Head-mounted personal visual display apparatus with image generator and holderI O DISPLAY SYSTEMS LLC·Filed 1999·Granted Apr 9, 2002·581 cites·23 claims
- 0296US5991085AHead-mounted personal visual display apparatus with image generator and holderI O DISPLAY SYSTEMS LLC·Filed 1996·Granted Nov 23, 1999·649 cites·22 claims
- 0391US9646425B2Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portionsMITUTOYO CORP·Filed 2015·Granted May 9, 2017·12 cites·16 claims
- 0488US9639083B2System and method for programming workpiece feature inspection operations for a coordinate measuring machineMITUTOYO CORP·Filed 2013·Granted May 2, 2017·10 cites·33 claims
- 0585US8271895B2GUI for programming step and repeat operations in a machine vision inspection systemTSEO ERIC YEH-WEI·Filed 2010·Granted Sep 18, 2012·16 cites·19 claims
- 0682US9952586B2Inspection program editing environment with simulation status and control continually responsive to selection operationsMITUTOYO CORP·Filed 2015·Granted Apr 24, 2018·4 cites·20 claims
- 0753US10254113B2Inspection program editing environment providing user defined collision avoidance volumesMITUTOYO CORP·Filed 2016·Granted Apr 9, 2019·0 cites·30 claims
- 0838US2018194017A1Depth controllable cutting apparatusTSEO ERIC YEH WEI·Filed 2017·Application pending·0 cites
- 0935US10990075B2Context sensitive relational feature/measurement command menu display in coordinate measurement machine (CMM) user interfaceMITUTOYO CORP·Filed 2016·Granted Apr 27, 2021·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →