Inventor · disambiguated record
John M. Peterson
Also filed as: PETERSON JOHN · PETERSON JOHN M · PETERSON JOHN MICHAEL
15 granted patents·322 citations·filing 1976–2022
92Inventor score
Top patents by PatentIndex Score
15 records- 0197US4022405AFan lift-cruise v/stol aircraftUS NAVY·Filed 1976·Granted May 10, 1977·104 cites·5 claims
- 0292US5115997ASurveillance balloonTELEDYNE IND·Filed 1990·Granted May 26, 1992·79 cites·32 claims
- 0391US4123392ANon-combustible nuclear radiation shields with high hydrogen contentCHEMTREE CORP·Filed 1976·Granted Oct 31, 1978·53 cites·22 claims
- 0487US11456955B2Tenant-based mapping for virtual routing and forwardingJUNIPER NETWORKS INC·Filed 2021·Granted Sep 27, 2022·2 cites·20 claims
- 0583US12137045B2Metric-based multi-hop path selectionJUNIPER NETWORKS INC·Filed 2021·Granted Nov 5, 2024·1 cites·20 claims
- 0682US4887397AFast, erectable, easily transportable structuresTELEDYNE IND·Filed 1988·Granted Dec 19, 1989·47 cites·26 claims
- 0777US10677845B2Converged test platforms and processes for class and system testing of integrated circuitsINTEL CORP·Filed 2017·Granted Jun 9, 2020·2 cites·28 claims
- 0871US7085659B2Dynamic energy threshold calculation for high impedance fault detectionABB TECHNOLOGY AG·Filed 2004·Granted Aug 1, 2006·17 cites·22 claims
- 0963US7272515B2Digital signal processor implementation of high impedance fault algorithmsABB RESEARCH LTD·Filed 2005·Granted Sep 18, 2007·4 cites·11 claims
- 1060US12155553B2Metric-based multi-hop path selectionJUNIPER NETWORKS INC·Filed 2021·Granted Nov 26, 2024·0 cites·18 claims
- 1158US10247773B2Systems and methods for wireless device testingINTEL CORP·Filed 2016·Granted Apr 2, 2019·1 cites·14 claims
- 1253US12003379B2Service and topology exchange protocol having client-driven active-active repositories with high availabilityJUNIPER NETWORKS INC·Filed 2022·Granted Jun 4, 2024·0 cites·20 claims
- 1349US4188232AMini-aggregate iron ore in cement matrixHALL WILLIAM C·Filed 1977·Granted Feb 12, 1980·10 cites·7 claims
- 1442US8451574B2Method and system for through fault detection in electrical devicesDAS RATAN·Filed 2006·Granted May 28, 2013·2 cites·15 claims
- 1540US9506980B2Integrated circuit testing architectureDETOFSKY ABRAM M·Filed 2013·Granted Nov 29, 2016·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →