Inventor · disambiguated record
Florian Bayer
Also filed as: BAYER FLORIAN
3 granted patents·4 pending applications·0 citations·filing 2014–2024
39Inventor score
Files withEOS GMBH ELECTRO OPTICAL SYSTEMS2SIEMENS AG2MINEBEA MITSUMI INC1THORLABS INC1ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH1
Top patents by PatentIndex Score
7 records- 0157US2025271381A1Sensor arrangement for an apparatus for additive manufacturing, and apparatus therefor, and measuring method on the basis thereofEOS GMBH ELECTRO OPTICAL SYSTEMS·Filed 2022·Application pending·0 cites
- 0255US2025135554A1Sensor arrangement for an apparatus for additive manufacturing, apparatus for additive manufacturing and test methodEOS GMBH ELECTRO OPTICAL SYSTEMS·Filed 2022·Application pending·0 cites
- 0349US11218095B2Method for controlling an actuatorMINEBEA MITSUMI INC·Filed 2019·Granted Jan 4, 2022·0 cites·22 claims
- 0449US2025180793A1Periodically oriented crystals as a bright source of polarization-entangled photonsTHORLABS INC·Filed 2024·Application pending·0 cites
- 0543US9500602B2Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanningSIEMENS AG·Filed 2014·Granted Nov 22, 2016·0 cites·20 claims
- 0642US9498171B2Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurementSIEMENS AG·Filed 2014·Granted Nov 22, 2016·0 cites·18 claims
- 0731US2018051983A1Measurement system and method for configuring the measurement systemZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →