Inventor · disambiguated record
Atchyuth K. Gorti
Also filed as: GORTI ATCHYUTH · GORTI ATCHYUTH K
13 granted patents·2 pending applications·40 citations·filing 2007–2025
89Inventor score
Top patents by PatentIndex Score
15 records- 0185US9024650B2Scalable built-in self test (BIST) architectureADVANCED MICRO DEVICES INC·Filed 2012·Granted May 5, 2015·8 cites·24 claims
- 0280US8633725B2Scan or JTAG controllable capture clock generationGORTI ATCHYUTH K·Filed 2010·Granted Jan 21, 2014·5 cites·7 claims
- 0377US9009552B2Scan-based resetKWAN BILL K·Filed 2010·Granted Apr 14, 2015·5 cites·22 claims
- 0476US12272189B2Autonomous driving system component fault predictionTESLA INC·Filed 2023·Granted Apr 8, 2025·0 cites·18 claims
- 0575US11640733B2Autonomous driving system component fault predictionTESLA INC·Filed 2018·Granted May 2, 2023·2 cites·20 claims
- 0675US2025218231A1Autonomous driving system component fault predictionTESLA INC·Filed 2025·Application pending·0 cites
- 0774US9436567B2Memory bit MBIST architecture for parallel master and slave executionADVANCED MICRO DEVICES INC·Filed 2012·Granted Sep 6, 2016·5 cites·18 claims
- 0874US9046574B2Test circuit having scan warm-upADVANCED MICRO DEVICES INC·Filed 2012·Granted Jun 2, 2015·3 cites·23 claims
- 0968US7681099B2Techniques for integrated circuit clock signal manipulation to facilitate functional and speed testADVANCED MICRO DEVICES INC·Filed 2007·Granted Mar 16, 2010·6 cites·20 claims
- 1062US9903913B2Scan or JTAG controllable capture clock generationADVANCED MICRO DEVICES INC·Filed 2014·Granted Feb 27, 2018·1 cites·13 claims
- 1161US8887012B2Method and apparatus for saving and restoring soft repair dataKWAN BILL K·Filed 2010·Granted Nov 11, 2014·3 cites·15 claims
- 1261US8661302B2Enhanced debug/test capability to a core reset processGORTI ATCHYUTH K·Filed 2010·Granted Feb 25, 2014·2 cites·19 claims
- 1346US9291676B2Scan warmup scheme for mitigating di/dt during scan testADVANCED MICRO DEVICES INC·Filed 2013·Granted Mar 22, 2016·0 cites·15 claims
- 1443US8694842B2Configurable Mux-D scan flip-flop designGORTI ATCHYUTH K·Filed 2010·Granted Apr 8, 2014·0 cites·21 claims
- 1531US2012124440A1Lbist diagnostic schemeGORTI ATCHYUTH K·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →