Inventor · disambiguated record
Kristina Helena Valborg Hedengren
Also filed as: HEDENGREN KRISTINA H · HEDENGREN KRISTINA H V · HEDENGREN KRISTINA HELENA VAL · HEDENGREN KRISTINA HELENA VALB
35 granted patents·2,406 citations·filing 1986–2002
98Inventor score
Top patents by PatentIndex Score
35 records- 0196US5182513AMethod and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testingGEN ELECTRIC·Filed 1991·Granted Jan 26, 1993·157 cites·12 claims
- 0295US6701615B2Inspection and sorting system and method for part repairGEN ELECTRIC·Filed 2002·Granted Mar 9, 2004·77 cites·56 claims
- 0395US4803639AX-ray inspection systemGEN ELECTRIC·Filed 1986·Granted Feb 7, 1989·289 cites·18 claims
- 0494US5659248AMultilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanningGEN ELECTRIC·Filed 1996·Granted Aug 19, 1997·150 cites·9 claims
- 0594US5389876AFlexible eddy current surface measurement array for detecting near surface flaws in a conductive partGEN ELECTRIC·Filed 1991·Granted Feb 14, 1995·142 cites·29 claims
- 0694US5262722AApparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe arrayGEN ELECTRIC·Filed 1992·Granted Nov 16, 1993·134 cites·28 claims
- 0792US6180867B1Thermal sensor array and methods of fabrication and useGEN ELECTRIC·Filed 1999·Granted Jan 30, 2001·109 cites·34 claims
- 0892US5371462AEddy current inspection method employing a probe array with test and reference data acquisition and signal processingGEN ELECTRIC·Filed 1993·Granted Dec 6, 1994·115 cites·20 claims
- 0992US5315234AEddy current device for inspecting a component having a flexible support with a plural sensor arrayGEN ELECTRIC·Filed 1992·Granted May 24, 1994·113 cites·35 claims
- 1092US5237271AApparatus and method for non-destructive testing using multi-frequency eddy currentsGEN ELECTRIC·Filed 1991·Granted Aug 17, 1993·108 cites·17 claims
- 1191US5345514AMethod for inspecting components having complex geometric shapesGEN ELECTRIC·Filed 1991·Granted Sep 6, 1994·143 cites·34 claims
- 1288US6550681B1Internet related appliancesGEN ELECTRIC·Filed 2000·Granted Apr 22, 2003·46 cites·20 claims
- 1388US4920491AEnhancement of image quality by utilization of a priori informationGEN ELECTRIC·Filed 1988·Granted Apr 24, 1990·87 cites·10 claims
- 1479US5073910ASquare wave cone beam scanning trajectory for data completeness in three-dimensional computerized tomographyGEN ELECTRIC·Filed 1990·Granted Dec 17, 1991·47 cites·22 claims
- 1578US5909004AThermocouple array and method of fabricationGEN ELECTRIC·Filed 1996·Granted Jun 1, 1999·46 cites·19 claims
- 1676US5006800AEddy current imaging apparatus and method using phase difference detectionGEN ELECTRIC·Filed 1989·Granted Apr 9, 1991·36 cites·18 claims
- 1775US6697764B2Reduced access field inspection system and apparatusGEN ELECTRIC·Filed 2001·Granted Feb 24, 2004·23 cites·16 claims
- 1874US5371461AApparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elementsGEN ELECTRIC·Filed 1993·Granted Dec 6, 1994·39 cites·20 claims
- 1973US5903147AEddy current array inspection device for shaped holesGEN ELECTRIC·Filed 1997·Granted May 11, 1999·44 cites·6 claims
- 2073US5420429AMultilayer transducer arrayGEN ELECTRIC·Filed 1993·Granted May 30, 1995·26 cites·21 claims
- 2172US6252393B1System and method for normalizing and calibrating a sensor arrayGEN ELECTRIC·Filed 1999·Granted Jun 26, 2001·35 cites·18 claims
- 2271US5841277AHand-holdable probe having a flexible eddy current sensorGEN ELECTRIC·Filed 1997·Granted Nov 24, 1998·40 cites·8 claims
- 2371US5418457ASystem and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surfaceGEN ELECTRIC·Filed 1993·Granted May 23, 1995·35 cites·15 claims
- 2467US6084174AMethod for detecting temperature gradients in biological tissue using a thermocouple arrayGEN ELECTRIC·Filed 1999·Granted Jul 4, 2000·30 cites·2 claims
- 2564US5463201ASeam-tracking apparatus for a welding system employing an array of eddy current elementsGEN ELECTRIC·Filed 1993·Granted Oct 31, 1995·23 cites·22 claims
- 2662US5319693AThree dimensional computerized tomography scanning configuration for imaging large objects with smaller area detectorsGEN ELECTRIC·Filed 1992·Granted Jun 7, 1994·96 cites·19 claims
- 2758US6916290B2In situ tumor temperature profile measuring probe and methodGEN ELECTRIC·Filed 2002·Granted Jul 12, 2005·15 cites·9 claims
- 2855US5717332ASystem and method using eddy currents to acquire positional data relating to fibers in a compositeGEN ELECTRIC·Filed 1997·Granted Feb 10, 1998·20 cites·7 claims
- 2954US6419635B1In situ tumor temperature profile measuring probe and methodGEN ELECTRIC COMPSANY·Filed 2000·Granted Jul 16, 2002·15 cites·2 claims
- 3054US5801532AHand-holdable eddy-current probeGEN ELECTRIC·Filed 1997·Granted Sep 1, 1998·18 cites·18 claims
- 3151US5611026ACombining a priori data with partial scan data to project three dimensional imaging of arbitrary objects with computerized tomographyGEN ELECTRIC·Filed 1995·Granted Mar 11, 1997·21 cites·6 claims
- 3248US5822392AMulti-resolution detection for increasing in an x-ray imaging implementation of an objectGEN ELECTRIC·Filed 1996·Granted Oct 13, 1998·13 cites·32 claims
- 3348US5278884AComplete 3D CT data acquisition using practical scanning paths on the surface of a sphereGEN ELECTRIC·Filed 1992·Granted Jan 11, 1994·45 cites·20 claims
- 3446US5895871AFinger controlled inspection apparatusGEN ELECTRIC·Filed 1997·Granted Apr 20, 1999·36 cites·14 claims
- 3544US6029530AFinger controlled inspection apparatusGEN ELECTRIC·Filed 1998·Granted Feb 29, 2000·33 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Kristina Helena Valborg Hedengren files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →