Inventor · disambiguated record
Stefan De Gendt
Also filed as: DE GENDT STEFAN
10 granted patents·6 pending applications·505 citations·filing 2006–2021
87Inventor score
Top patents by PatentIndex Score
16 records- 0197US7579285B2Atomic layer deposition method for depositing a layerIMEC·Filed 2006·Granted Aug 25, 2009·464 cites·37 claims
- 0290US8415209B2Method of manufacturing a complementary nanowire tunnel field effect transistor semiconductor deviceROOYACKERS RITA·Filed 2011·Granted Apr 9, 2013·28 cites·12 claims
- 0381US10369775B2Method of releasing graphene from substrateIMEC VZW·Filed 2017·Granted Aug 6, 2019·3 cites·17 claims
- 0475US9184270B2Graphene based field effect transistorIMEC·Filed 2014·Granted Nov 10, 2015·3 cites·9 claims
- 0574US7964039B2Cleaning of plasma chamber walls using noble gas cleaning stepIMEC·Filed 2008·Granted Jun 21, 2011·3 cites·9 claims
- 0663US9024299B2Method for fabricating a dual work function semiconductor device and the device made thereofLI ZILAN·Filed 2009·Granted May 5, 2015·4 cites·11 claims
- 0750US11898958B2Method for measuring the trap density in a 2-dimensional semiconductor materialIMEC VZW·Filed 2021·Granted Feb 13, 2024·0 cites·9 claims
- 0848US8021948B2Scalable interpoly dielectric stacks with improved immunity to program saturationIMEC·Filed 2008·Granted Sep 20, 2011·0 cites·8 claims
- 0942US8211812B2Method for fabricating a high-K dielectric layerRAGNARSSON LARS-AKE·Filed 2008·Granted Jul 3, 2012·0 cites·15 claims
- 1041US8441064B2Scalable interpoly dielectric stacks with improved immunity to program saturationGOVOREANU BOGDAN·Filed 2011·Granted May 14, 2013·0 cites·16 claims
- 1141US2008164581A1Electronic device and process for manufacturing the sameIMEC INTER UNI MICRO ELECTR·Filed 2008·Application pending·0 cites
- 1240US2008308881A1Method for Controlled Formation of a Gate Dielectric StackIMEC INTER UNI MICRO ELECTR·Filed 2008·Application pending·0 cites
- 1340US2008254605A1Method of reducing the interfacial oxide thicknessIMEC INTER UNI MICRO ELECTR·Filed 2007·Application pending·0 cites
- 1438US2007272967A1Method for Modulating the Effective Work FunctionIMEC INTER UNI MICRO ELECTR·Filed 2007·Application pending·0 cites
- 1536US2009050982A1Method for Modulating the Effective Work FunctionIMEC INTER UNI MICRO ELECTR·Filed 2007·Application pending·0 cites
- 1633US2011006406A1Fabrication of porogen residues free and mechanically robust low-k materialsIMEC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →