Inventor · disambiguated record

Ching-Yi Hung

Also filed as: HUNG CHING-YI

2 granted patents·4 citations·filing 2016–2018

48Inventor score

Technology areasG03F

Files withASML NETHERLANDS BV2

Top patents by PatentIndex Score

2 records

0184US9869940B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2016·Granted Jan 16, 2018·3 cites·18 claims
0274US10261427B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Apr 16, 2019·1 cites·8 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →